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{ ?s ?p RC Tightened Corner Test structure Design and Silicon Characterization in FinFET Technology ?g. }
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W3115808545
title
"
RC Tightened Corner Test structure Design and Silicon Characterization in FinFET Technology
"
@default
.
W3205852422
title
"
RC Tightened Corner Test structure Design and Silicon Characterization in FinFET Technology
"
@default
.
