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- W2099754468 abstract "We present a large system model capable of producing Pareto charts for several yield metrics, including effective channel length, poly line width, I/sub on/ and I/sub sub/. These Pareto charts enable us to target specific processes for improvement of the yield metric(s). Our neural network model has an accuracy of 80% and can be trained with a small data set to minimize the feedback time in the control loop for the yield. The system we describe has been implemented in a Lucent Technologies microelectronics lab in Orlando, FL." @default.
- W2099754468 created "2016-06-24" @default.
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- W2099754468 date "2001-01-01" @default.
- W2099754468 modified "2023-09-27" @default.
- W2099754468 title "A system model for feedback control and analysis of yield: A multistep process model of effective gate length, poly line width, and IV parameters" @default.
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- W2099754468 doi "https://doi.org/10.1109/66.909653" @default.
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