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• W2140678039 endingPage "1031" @default.
• W2140678039 startingPage "1016" @default.
• W2140678039 abstract "This paper presents a fatigue damage model to estimate fatigue lives of microelectromechanical systems (MEMS) devices and account for the effects of topological randomness of material microstructure. For this purpose, the damage mechanics modeling approach is incorporated into a new Voronoi finite-element model (VFEM). The VFEM developed for this investigation is able to consider both intergranular crack initiation (debonding) and propagation stages. The model relates the fatigue life to a damage parameter <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>D</i> which is a measure of the gradual material degradation under cyclic loading. The fatigue damage model is then used to investigate the effects of microstructure randomness on the fatigue of MEMS. In this paper, three different types of randomness are considered: (1) randomness in the microstructure due to random shapes and sizes of the material grains; (2) the randomness in the material properties considering a normally (Gaussian) distributed elastic modulus; and (3) the randomness in the material properties considering a normally distributed resistance stress, which is the experimentally determined material property controlling the ability of a material to resist the damage accumulation. Thirty-one numerical models of MEMS specimens are considered under cyclic axial and bending loading conditions. It is observed that the stress-life results obtained are in good agreement with the experimental study. The effects of material inhomogeneity and internal voids are numerically investigated." @default.
• W2140678039 created "2016-06-24" @default.
• W2140678039 creator A5000655355 @default.
• W2140678039 creator A5005352306 @default.
• W2140678039 creator A5073681876 @default.
• W2140678039 date "2009-10-01" @default.
• W2140678039 modified "2023-09-23" @default.
• W2140678039 title "A Numerical Fatigue Damage Model for Life Scatter of MEMS Devices" @default.
• W2140678039 cites W1541118220 @default.
• W2140678039 cites W1601857886 @default.
• W2140678039 cites W1965547560 @default.
• W2140678039 cites W1965954438 @default.
• W2140678039 cites W1966631957 @default.
• W2140678039 cites W1968105573 @default.
• W2140678039 cites W1984672845 @default.
• W2140678039 cites W1992313513 @default.
• W2140678039 cites W1995243490 @default.
• W2140678039 cites W1996286406 @default.
• W2140678039 cites W2026401158 @default.
• W2140678039 cites W2027019914 @default.
• W2140678039 cites W2027248520 @default.
• W2140678039 cites W2029268131 @default.
• W2140678039 cites W2046760204 @default.
• W2140678039 cites W2062529820 @default.
• W2140678039 cites W2073337960 @default.
• W2140678039 cites W2073491897 @default.
• W2140678039 cites W2088886512 @default.
• W2140678039 cites W2091288756 @default.
• W2140678039 cites W2093164722 @default.
• W2140678039 cites W2093712558 @default.
• W2140678039 cites W2096377642 @default.
• W2140678039 cites W2101029061 @default.
• W2140678039 cites W2108918332 @default.
• W2140678039 cites W2109205893 @default.
• W2140678039 cites W2122336830 @default.
• W2140678039 cites W2123106353 @default.
• W2140678039 cites W2125276515 @default.
• W2140678039 cites W2139331483 @default.
• W2140678039 cites W2180202767 @default.
• W2140678039 cites W2565614670 @default.
• W2140678039 cites W2727420541 @default.
• W2140678039 cites W3015197182 @default.
• W2140678039 doi "https://doi.org/10.1109/jmems.2009.2024800" @default.
• W2140678039 hasPublicationYear "2009" @default.
• W2140678039 type Work @default.
• W2140678039 sameAs 2140678039 @default.
• W2140678039 citedByCount "25" @default.
• W2140678039 countsByYear W21406780392012 @default.
• W2140678039 countsByYear W21406780392013 @default.
• W2140678039 countsByYear W21406780392014 @default.
• W2140678039 countsByYear W21406780392015 @default.
• W2140678039 countsByYear W21406780392016 @default.
• W2140678039 countsByYear W21406780392018 @default.
• W2140678039 countsByYear W21406780392019 @default.
• W2140678039 countsByYear W21406780392020 @default.
• W2140678039 countsByYear W21406780392021 @default.
• W2140678039 countsByYear W21406780392022 @default.
• W2140678039 countsByYear W21406780392023 @default.
• W2140678039 crossrefType "journal-article" @default.
• W2140678039 hasAuthorship W2140678039A5000655355 @default.
• W2140678039 hasAuthorship W2140678039A5005352306 @default.
• W2140678039 hasAuthorship W2140678039A5073681876 @default.
• W2140678039 hasBestOaLocation W21406780392 @default.
• W2140678039 hasConcept C105795698 @default.
• W2140678039 hasConcept C125112378 @default.
• W2140678039 hasConcept C127413603 @default.
• W2140678039 hasConcept C135628077 @default.
• W2140678039 hasConcept C138885662 @default.
• W2140678039 hasConcept C159985019 @default.
• W2140678039 hasConcept C171250308 @default.
• W2140678039 hasConcept C192562407 @default.
• W2140678039 hasConcept C193867417 @default.
• W2140678039 hasConcept C21036866 @default.
• W2140678039 hasConcept C31555180 @default.
• W2140678039 hasConcept C33923547 @default.
• W2140678039 hasConcept C37977207 @default.
• W2140678039 hasConcept C41895202 @default.
• W2140678039 hasConcept C59085676 @default.
• W2140678039 hasConcept C66938386 @default.
• W2140678039 hasConcept C87976508 @default.
• W2140678039 hasConceptScore W2140678039C105795698 @default.
• W2140678039 hasConceptScore W2140678039C125112378 @default.
• W2140678039 hasConceptScore W2140678039C127413603 @default.
• W2140678039 hasConceptScore W2140678039C135628077 @default.
• W2140678039 hasConceptScore W2140678039C138885662 @default.
• W2140678039 hasConceptScore W2140678039C159985019 @default.
• W2140678039 hasConceptScore W2140678039C171250308 @default.
• W2140678039 hasConceptScore W2140678039C192562407 @default.
• W2140678039 hasConceptScore W2140678039C193867417 @default.
• W2140678039 hasConceptScore W2140678039C21036866 @default.
• W2140678039 hasConceptScore W2140678039C31555180 @default.
• W2140678039 hasConceptScore W2140678039C33923547 @default.
• W2140678039 hasConceptScore W2140678039C37977207 @default.
• W2140678039 hasConceptScore W2140678039C41895202 @default.
• W2140678039 hasConceptScore W2140678039C59085676 @default.
• W2140678039 hasConceptScore W2140678039C66938386 @default.
• W2140678039 hasConceptScore W2140678039C87976508 @default.
• W2140678039 hasIssue "5" @default.

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