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- W1569691807 abstract "Shrinking the dimensions of electrified interfacial systems from the micrometer- to the nanometer-scale regime often leads to effects in the electronic properties appearing that are not easily scalable. This chapter discusses how scanning tunneling microscopy (STM) z–V spectroscopy can be used as a direct probe of the injection energies, Ep- and Ep+, for electrons and holes into polaronic states, respectively, of an organic material. The measurements were carried out at RT under ultrahigh vacuum (UHV) conditions, typically at base pressure in the 10–10 mbar range. To acquire STM z–V spectra, commercial ion-milled platinum–iridium tips were used. The organic thin films of tris(8-hydroxyquinoline)aluminum (Alq3) and copper phthalocyanine (CuPc) were prepared in situ by thermal evaporation on atomically flat Au(1 1 1) and Ag(1 1 1) single-crystal substrates at RT. Measuring electronic properties by means of STM z–V spectroscopy is applied to thin films consisting of soft materials or to solution-based systems." @default.
- W1569691807 created "2016-06-24" @default.
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- W1569691807 date "2015-01-21" @default.
- W1569691807 modified "2023-09-26" @default.
- W1569691807 title "Nanometer‐Scale View of the Electrified Interface: A Scanning Probe Microscopy Study" @default.
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- W1569691807 doi "https://doi.org/10.1002/9783527679195.ch25" @default.
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