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• W2007584101 abstract "Research Article| January 02, 2003 Considerations in Zircon Geochronology by SIMS Trevor R. Ireland; Trevor R. Ireland Research School of Earth Sciences, The Australian National University, Canberra ACT 0200, Australia, trevor.ireland@anu.edu.au Search for other works by this author on: GSW Google Scholar Ian S. Williams Ian S. Williams Research School of Earth Sciences, The Australian National University, Canberra ACT 0200, Australia, trevor.ireland@anu.edu.au Search for other works by this author on: GSW Google Scholar Author and Article Information Trevor R. Ireland Research School of Earth Sciences, The Australian National University, Canberra ACT 0200, Australia, trevor.ireland@anu.edu.au Ian S. Williams Research School of Earth Sciences, The Australian National University, Canberra ACT 0200, Australia, trevor.ireland@anu.edu.au Publisher: Mineralogical Society of America First Online: 03 Mar 2017 © The Mineralogical Society Of America Reviews in Mineralogy and Geochemistry (2003) 53 (1): 215–241. https://doi.org/10.2113/0530215 Article history First Online: 03 Mar 2017 Cite View This Citation Add to Citation Manager Share Icon Share Facebook Twitter LinkedIn MailTo Tools Icon Tools Get Permissions Search Site Citation Trevor R. Ireland, Ian S. Williams; Considerations in Zircon Geochronology by SIMS. Reviews in Mineralogy and Geochemistry 2003;; 53 (1): 215–241. doi: https://doi.org/10.2113/0530215 Download citation file: Ris (Zotero) Refmanager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentBy SocietyReviews in Mineralogy and Geochemistry Search Advanced Search Secondary ion mass spectrometry (SIMS) is a versatile technique for measuring the chemical and isotopic composition of solid materials on a scale of a few microns. A beam of high-energy primary ions is focused onto the polished target surface, sputtering (ablating) atoms and molecules, and in the process ionizing a small fraction. These secondary ions, which reflect the target composition, are analyzed by mass spectrometry. The SIMS instrument most common in geoscience is the ion microprobe, which uses a focused primary ion beam in either static or scanning mode to sample target areas usually 10- to 50-μm diameter. Total sampling... You do not have access to this content, please speak to your institutional administrator if you feel you should have access." @default.
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• W2007584101 date "2003-01-01" @default.
• W2007584101 modified "2023-10-03" @default.
• W2007584101 title "Considerations in Zircon Geochronology by SIMS" @default.
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• W2007584101 doi "https://doi.org/10.2113/0530215" @default.
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