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• W2034363141 abstract "Abstract Recent developments in SIMS with both Ar cluster ions and swift heavy ions are presented. With these primary beams, the analysis of organic semiconductors and animal cells shows that one of the key factors to realizing the SIMS analysis of organic materials is high‐energy deposition near the surface. Molecular depth profiling and images of organic materials were demonstrated by using SIMS. Copyright © 2010 John Wiley & Sons, Ltd." @default.
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• W2034363141 date "2010-09-09" @default.
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• W2034363141 title "SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials" @default.
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• W2034363141 doi "https://doi.org/10.1002/sia.3585" @default.
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