Matches in SemOpenAlex for { <https://semopenalex.org/concept/C44445679> ?p ?o ?g. }
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- C44445679 created "2016-06-24" @default.
- C44445679 modified "2023-10-18" @default.
- C44445679 type Concept @default.
- C44445679 seeAlso "https://en.wikipedia.org/wiki/Wafer%20testing" @default.
- C44445679 sameAs Q2538844 @default.
- C44445679 sameAs 44445679 @default.
- C44445679 broader C119599485 @default.
- C44445679 broader C121332964 @default.
- C44445679 broader C127413603 @default.
- C44445679 broader C160671074 @default.
- C44445679 broader C171250308 @default.
- C44445679 broader C192562407 @default.
- C44445679 broader C49040817 @default.
- C44445679 inScheme concepts @default.
- C44445679 note "step performed during semiconductor device fabrication by applying special test patterns to a wafer before it is sent to die preparation" @default.
- C44445679 prefLabel "Wafer testing" @default.
- C44445679 related C116372231 @default.
- C44445679 related C118702147 @default.
- C44445679 related C126233035 @default.
- C44445679 related C126355924 @default.
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- C44445679 related C8002213 @default.
- C44445679 citedByCount "11246" @default.
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- C44445679 countsByYear C444456792016 @default.
- C44445679 countsByYear C444456792017 @default.
- C44445679 countsByYear C444456792018 @default.
- C44445679 countsByYear C444456792019 @default.
- C44445679 countsByYear C444456792020 @default.
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- C44445679 level "3" @default.
- C44445679 magId "44445679" @default.
- C44445679 worksCount "1826" @default.