Matches in SemOpenAlex for { <https://semopenalex.org/concept/C86642149> ?p ?o ?g. }
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- C86642149 created "2016-06-24" @default.
- C86642149 modified "2023-10-18" @default.
- C86642149 type Concept @default.
- C86642149 seeAlso "https://en.wikipedia.org/wiki/Stress-induced%20leakage%20current" @default.
- C86642149 sameAs Q7390375 @default.
- C86642149 sameAs 86642149 @default.
- C86642149 broader C120398109 @default.
- C86642149 broader C121332964 @default.
- C86642149 broader C178790620 @default.
- C86642149 broader C185592680 @default.
- C86642149 broader C191897082 @default.
- C86642149 broader C192562407 @default.
- C86642149 broader C26873012 @default.
- C86642149 broader C2779851234 @default.
- C86642149 broader C49040817 @default.
- C86642149 broader C62520636 @default.
- C86642149 inScheme concepts @default.
- C86642149 note "increase in gate leakage current of MOSFETs" @default.
- C86642149 prefLabel "SILC" @default.
- C86642149 related C16317505 @default.
- C86642149 related C2361726 @default.
- C86642149 related C2778413303 @default.
- C86642149 related C72688512 @default.
- C86642149 related C73500089 @default.
- C86642149 citedByCount "17084" @default.
- C86642149 countsByYear C866421492012 @default.
- C86642149 countsByYear C866421492013 @default.
- C86642149 countsByYear C866421492014 @default.
- C86642149 countsByYear C866421492015 @default.
- C86642149 countsByYear C866421492016 @default.
- C86642149 countsByYear C866421492017 @default.
- C86642149 countsByYear C866421492018 @default.
- C86642149 countsByYear C866421492019 @default.
- C86642149 countsByYear C866421492020 @default.
- C86642149 countsByYear C866421492021 @default.
- C86642149 countsByYear C866421492022 @default.
- C86642149 countsByYear C866421492023 @default.
- C86642149 level "3" @default.
- C86642149 magId "86642149" @default.
- C86642149 worksCount "1287" @default.