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- W23162012101 hasURL "https://doi.org/10.1017/s1431927614006989" @default.
- W23162012101 type Location @default.
- W23162012101 hasSource S98208149 @default.
- W23162012101 hasVersion "publishedVersion" @default.
- W23162012101 isOa "true" @default.
- W23162012101 pdfUrl "https://www.cambridge.org/core/services/aop-cambridge-core/content/view/D4CC139536A894911F11FC31921836A9/S1431927614006989a.pdf/div-class-title-quantitative-strain-measurement-in-semiconductor-devices-by-scanning-moire-fringe-imaging-div.pdf" @default.