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- S4210179240 issn "2520-811X" @default.
- S4210179240 issn "2520-8128" @default.
- S4210179240 created "2022-02-03" @default.
- S4210179240 modified "2023-10-19" @default.
- S4210179240 h-index "18" @default.
- S4210179240 hasIssnL "2520-811X" @default.
- S4210179240 countryCode "SG" @default.
- S4210179240 type Source @default.
- S4210179240 sameAs Q96717325 @default.
- S4210179240 homepage "https://www.springer.com/journal/41871" @default.
- S4210179240 name "Nanomanufacturing and Metrology" @default.
- S4210179240 2YrMeanCitedness "2.4461538461538463" @default.
- S4210179240 apcUsd "2090" @default.
- S4210179240 citedByCount "1376" @default.
- S4210179240 countsByYear S42101792402017 @default.
- S4210179240 countsByYear S42101792402018 @default.
- S4210179240 countsByYear S42101792402019 @default.
- S4210179240 countsByYear S42101792402020 @default.
- S4210179240 countsByYear S42101792402021 @default.
- S4210179240 countsByYear S42101792402022 @default.
- S4210179240 countsByYear S42101792402023 @default.
- S4210179240 hasHostOrganization P4310319900 @default.
- S4210179240 i10Index "45" @default.
- S4210179240 isInDoaj "false" @default.
- S4210179240 isOa "false" @default.
- S4210179240 sourceType "journal" @default.
- S4210179240 worksCount "182" @default.