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- S73404582 issn "0740-7475" @default.
- S73404582 issn "1558-1918" @default.
- S73404582 created "2016-06-24" @default.
- S73404582 modified "2023-10-19" @default.
- S73404582 h-index "105" @default.
- S73404582 hasIssnL "0740-7475" @default.
- S73404582 countryCode "US" @default.
- S73404582 type Source @default.
- S73404582 sameAs 73404582 @default.
- S73404582 name "IEEE Design & Test of Computers" @default.
- S73404582 alternativeName "Design & test of computers" @default.
- S73404582 alternativeName "Design & test of computers, IEEE" @default.
- S73404582 alternativeName "Design and test of computers" @default.
- S73404582 alternativeName "IEEE design and test of computers" @default.
- S73404582 alternativeName "IEEE design and test" @default.
- S73404582 alternativeName "Institute of Electrical and Electronics Engineers design and test of computers" @default.
- S73404582 2YrMeanCitedness "0" @default.
- S73404582 citedByCount "46854" @default.
- S73404582 countsByYear S734045822012 @default.
- S73404582 countsByYear S734045822013 @default.
- S73404582 countsByYear S734045822014 @default.
- S73404582 countsByYear S734045822015 @default.
- S73404582 countsByYear S734045822016 @default.
- S73404582 countsByYear S734045822017 @default.
- S73404582 countsByYear S734045822018 @default.
- S73404582 countsByYear S734045822019 @default.
- S73404582 countsByYear S734045822020 @default.
- S73404582 countsByYear S734045822021 @default.
- S73404582 countsByYear S734045822022 @default.
- S73404582 countsByYear S734045822023 @default.
- S73404582 hasHostOrganization P4310319808 @default.
- S73404582 i10Index "747" @default.
- S73404582 isInDoaj "false" @default.
- S73404582 isOa "false" @default.
- S73404582 magId "73404582" @default.
- S73404582 sourceType "journal" @default.
- S73404582 worksCount "3036" @default.