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- W4246070413 created "2022-05-12" @default.
- W4246070413 date "2011-01-01" @default.
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- W4246070413 title "Impact of ALD Gate Dielectrics (SiO2, HfO2, and SiO2/HAH) on Device Electrical Characteristics and Reliability of AlGaN/GaN MOSHFET Devices" @default.
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