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- W4246110949 created "2022-05-12" @default.
- W4246110949 date "2008-08-28" @default.
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- W4246110949 title "Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay" @default.
- W4246110949 doi "https://doi.org/10.1520/f0028-02" @default.
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