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- W4384659621 created "2023-07-20" @default.
- W4384659621 creator A5022598327 @default.
- W4384659621 date "2023-04-24" @default.
- W4384659621 modified "2023-09-23" @default.
- W4384659621 title "Review for Temperature dependence of <scp>ESD</scp> effects on 28 nm <scp>FD‐SOI MOSFETs</scp>" @default.
- W4384659621 doi "https://doi.org/10.1002/eng2.12729/v1/review2" @default.
- W4384659621 hasPublicationYear "2023" @default.
- W4384659621 type Work @default.
- W4384659621 citedByCount "0" @default.
- W4384659621 crossrefType "peer-review" @default.
- W4384659621 hasAuthorship W4384659621A5022598327 @default.
- W4384659621 hasConcept C192562407 @default.
- W4384659621 hasConcept C49040817 @default.
- W4384659621 hasConcept C53143962 @default.
- W4384659621 hasConcept C544956773 @default.
- W4384659621 hasConceptScore W4384659621C192562407 @default.
- W4384659621 hasConceptScore W4384659621C49040817 @default.
- W4384659621 hasConceptScore W4384659621C53143962 @default.
- W4384659621 hasConceptScore W4384659621C544956773 @default.
- W4384659621 hasLocation W43846596211 @default.
- W4384659621 hasOpenAccess W4384659621 @default.
- W4384659621 hasPrimaryLocation W43846596211 @default.
- W4384659621 hasRelatedWork W2012754971 @default.
- W4384659621 hasRelatedWork W2034653092 @default.
- W4384659621 hasRelatedWork W2101030291 @default.
- W4384659621 hasRelatedWork W2104300577 @default.
- W4384659621 hasRelatedWork W2168200057 @default.
- W4384659621 hasRelatedWork W2771786520 @default.
- W4384659621 hasRelatedWork W2898370298 @default.
- W4384659621 hasRelatedWork W2899084033 @default.
- W4384659621 hasRelatedWork W2944964251 @default.
- W4384659621 hasRelatedWork W44660823 @default.
- W4384659621 isParatext "false" @default.
- W4384659621 isRetracted "false" @default.
- W4384659621 workType "peer-review" @default.