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- NCIT_C78815 IAO_0000115 "An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the sample." @default.
- NCIT_C78815 NCIT_NHC0 "C78815" @default.
- NCIT_C78815 NCIT_P106 "Research Device" @default.
- NCIT_C78815 NCIT_P108 "Focused Ion Beam-Scanning Electron Microscope" @default.
- NCIT_C78815 NCIT_P207 "C2700202" @default.
- NCIT_C78815 NCIT_P366 "Focused_Ion_Beam_Scanning_Electron_Microscope" @default.
- NCIT_C78815 normalizedInformationContent "100" @default.
- NCIT_C78815 referenceCount "1" @default.
- NCIT_C78815 hasExactSynonym "FIB-SEM" @default.
- NCIT_C78815 hasExactSynonym "FIB/SEM" @default.
- NCIT_C78815 hasExactSynonym "Focused Ion Beam-Scanning Electron Microscope" @default.
- NCIT_C78815 type Class @default.
- NCIT_C78815 isDefinedBy ncit.owl @default.
- NCIT_C78815 label "Focused Ion Beam-Scanning Electron Microscope" @default.
- NCIT_C78815 subClassOf NCIT_C19238 @default.
- NCIT_C78815 subClassOf NCIT_C19747 @default.
- NCIT_C78815 subClassOf NCIT_C28219 @default.
- NCIT_C78815 subClassOf NCIT_C49755 @default.
- NCIT_C78815 subClassOf NCIT_C50069 @default.
- NCIT_C78815 subClassOf NCIT_C62103 @default.
- NCIT_C78815 subClassOf NCIT_C78814 @default.
- NCIT_C78815 subClassOf NCIT_C78815 @default.
- NCIT_C78815 subClassOf NCIT_C97325 @default.