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- NCIT_C78817 IAO_0000115 "An instrument that focuses an electron beam at a sample and measures the wavelengths and intensities of the X-rays emitted by the elements in the material." @default.
- NCIT_C78817 NCIT_NHC0 "C78817" @default.
- NCIT_C78817 NCIT_P106 "Research Device" @default.
- NCIT_C78817 NCIT_P108 "Electron Microprobe" @default.
- NCIT_C78817 NCIT_P207 "C2699862" @default.
- NCIT_C78817 NCIT_P366 "Electron_Microprobe" @default.
- NCIT_C78817 normalizedInformationContent "100" @default.
- NCIT_C78817 referenceCount "1" @default.
- NCIT_C78817 hasExactSynonym "EPMA" @default.
- NCIT_C78817 hasExactSynonym "Electron Microprobe" @default.
- NCIT_C78817 hasExactSynonym "Electron Probe Microanalyzer" @default.
- NCIT_C78817 type Class @default.
- NCIT_C78817 isDefinedBy ncit.owl @default.
- NCIT_C78817 label "Electron Microprobe" @default.
- NCIT_C78817 subClassOf NCIT_C16742 @default.
- NCIT_C78817 subClassOf NCIT_C19238 @default.
- NCIT_C78817 subClassOf NCIT_C62336 @default.
- NCIT_C78817 subClassOf NCIT_C62337 @default.
- NCIT_C78817 subClassOf NCIT_C78817 @default.
- NCIT_C78817 subClassOf NCIT_C97325 @default.