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- NCIT_C78873 IAO_0000115 "A technique that quantifies the x-rays emitted after ionization by a finely focused beam of electrons directed onto a flat polished specimen." @default.
- NCIT_C78873 NCIT_NHC0 "C78873" @default.
- NCIT_C78873 NCIT_P106 "Research Activity" @default.
- NCIT_C78873 NCIT_P108 "Electron Microprobe Analysis" @default.
- NCIT_C78873 NCIT_P207 "C2699863" @default.
- NCIT_C78873 NCIT_P366 "Electron_Microprobe_Analysis" @default.
- NCIT_C78873 normalizedInformationContent "100" @default.
- NCIT_C78873 referenceCount "1" @default.
- NCIT_C78873 hasExactSynonym "EMPA" @default.
- NCIT_C78873 hasExactSynonym "Electron Microprobe Analysis" @default.
- NCIT_C78873 type Class @default.
- NCIT_C78873 isDefinedBy ncit.owl @default.
- NCIT_C78873 label "Electron Microprobe Analysis" @default.
- NCIT_C78873 subClassOf NCIT_C16847 @default.
- NCIT_C78873 subClassOf NCIT_C19236 @default.
- NCIT_C78873 subClassOf NCIT_C20368 @default.
- NCIT_C78873 subClassOf NCIT_C43431 @default.
- NCIT_C78873 subClassOf NCIT_C78873 @default.