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- NCIT_C78874 IAO_0000115 "A transmission electron microscopy-based imaging technique in which the transmitted and diffracted beams are allowed to interfere, creating phase contrast that allows atomic columns to be documented." @default.
- NCIT_C78874 NCIT_NHC0 "C78874" @default.
- NCIT_C78874 NCIT_P106 "Research Activity" @default.
- NCIT_C78874 NCIT_P108 "High Resolution Transmission Electron Microscopy" @default.
- NCIT_C78874 NCIT_P207 "C2697588" @default.
- NCIT_C78874 NCIT_P366 "High_Resolution_Transmission_Electron_Microscopy" @default.
- NCIT_C78874 normalizedInformationContent "100" @default.
- NCIT_C78874 referenceCount "1" @default.
- NCIT_C78874 hasExactSynonym "Electron Phase Contrast Imaging" @default.
- NCIT_C78874 hasExactSynonym "HRTEM" @default.
- NCIT_C78874 hasExactSynonym "High Resolution Transmission Electron Microscopy" @default.
- NCIT_C78874 type Class @default.
- NCIT_C78874 isDefinedBy ncit.owl @default.
- NCIT_C78874 label "High Resolution Transmission Electron Microscopy" @default.
- NCIT_C78874 subClassOf NCIT_C16203 @default.
- NCIT_C78874 subClassOf NCIT_C16853 @default.
- NCIT_C78874 subClassOf NCIT_C16854 @default.
- NCIT_C78874 subClassOf NCIT_C18216 @default.
- NCIT_C78874 subClassOf NCIT_C25218 @default.
- NCIT_C78874 subClassOf NCIT_C25294 @default.
- NCIT_C78874 subClassOf NCIT_C43431 @default.
- NCIT_C78874 subClassOf NCIT_C74957 @default.
- NCIT_C78874 subClassOf NCIT_C78874 @default.