Matches in Wikidata for { <http://www.wikidata.org/entity/Q31150164> ?p ?o ?g. }
- Q31150164 description "2003 nî lūn-bûn" @default.
- Q31150164 description "2003 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած" @default.
- Q31150164 description "2003 թվականի սեպտեմբերին հրատարակված գիտական հոդված" @default.
- Q31150164 description "2003年の論文" @default.
- Q31150164 description "2003年論文" @default.
- Q31150164 description "2003年論文" @default.
- Q31150164 description "2003年論文" @default.
- Q31150164 description "2003年論文" @default.
- Q31150164 description "2003年論文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003年论文" @default.
- Q31150164 description "2003년 논문" @default.
- Q31150164 description "article científic" @default.
- Q31150164 description "article scientific" @default.
- Q31150164 description "article scientifique (publié 2003)" @default.
- Q31150164 description "articol științific" @default.
- Q31150164 description "articolo scientifico" @default.
- Q31150164 description "artigo científico (publicado na 2003)" @default.
- Q31150164 description "artigo científico (publicado na 2003)" @default.
- Q31150164 description "artigo científico" @default.
- Q31150164 description "artikull shkencor" @default.
- Q31150164 description "artikulong pang-agham" @default.
- Q31150164 description "artykuł naukowy" @default.
- Q31150164 description "artículo científico publicado en 2003" @default.
- Q31150164 description "artículu científicu espublizáu en 2003" @default.
- Q31150164 description "bilimsel makale" @default.
- Q31150164 description "bài báo khoa học" @default.
- Q31150164 description "mokslinis straipsnis" @default.
- Q31150164 description "naučni članak" @default.
- Q31150164 description "scienca artikolo" @default.
- Q31150164 description "scientific article" @default.
- Q31150164 description "teaduslik artikkel" @default.
- Q31150164 description "tieteellinen artikkeli" @default.
- Q31150164 description "tudományos cikk" @default.
- Q31150164 description "vedecký článok" @default.
- Q31150164 description "vetenskaplig artikel" @default.
- Q31150164 description "videnskabelig artikel (udgivet 2003)" @default.
- Q31150164 description "vitenskapelig artikkel" @default.
- Q31150164 description "vitskapeleg artikkel" @default.
- Q31150164 description "vědecký článek" @default.
- Q31150164 description "wetenschappelijk artikel" @default.
- Q31150164 description "wissenschaftlicher Artikel" @default.
- Q31150164 description "επιστημονικό άρθρο" @default.
- Q31150164 description "мақолаи илмӣ" @default.
- Q31150164 description "мақолаи илмӣ" @default.
- Q31150164 description "наукова стаття, опублікована у вересні 2003" @default.
- Q31150164 description "научна статия" @default.
- Q31150164 description "научная статья" @default.
- Q31150164 description "научни чланак" @default.
- Q31150164 description "научни чланак" @default.
- Q31150164 description "מאמר מדעי" @default.
- Q31150164 description "سائنسی مضمون" @default.
- Q31150164 description "مقالة علمية (نشرت في سبتمبر 2003)" @default.
- Q31150164 description "مقالهٔ علمی" @default.
- Q31150164 description "২০০৩-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ" @default.
- Q31150164 description "บทความทางวิทยาศาสตร์" @default.
- Q31150164 description "სამეცნიერო სტატია" @default.
- Q31150164 name "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 name "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 name "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 type Item @default.
- Q31150164 label "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 label "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 label "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 prefLabel "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 prefLabel "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 prefLabel "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces." @default.
- Q31150164 P1433 Q31150164-C2D86C2C-EA1C-4904-AFAF-76579FE80412 @default.
- Q31150164 P1476 Q31150164-F575D809-804F-4776-939D-DFA08C1EF143 @default.
- Q31150164 P2093 Q31150164-1F83CD04-211A-4C72-A3CA-0E20251132AB @default.
- Q31150164 P2860 Q31150164-12FBD0D7-ACEC-4088-85C2-B7A48843733E @default.
- Q31150164 P2860 Q31150164-53FD098E-2DD4-4655-9EC9-DB0B381DC52C @default.
- Q31150164 P2860 Q31150164-69AB770D-6BD1-4818-BA9A-4FF784D5A4A2 @default.
- Q31150164 P2860 Q31150164-81C29437-2F08-4697-9BCF-774B86D6DAF0 @default.
- Q31150164 P2860 Q31150164-A1C7B9B8-5EA2-473B-B55F-19066A7046D2 @default.
- Q31150164 P2860 Q31150164-E189F47B-8C29-495E-B113-DD3DFD3918DA @default.
- Q31150164 P2860 Q31150164-F130A4CA-5E50-4693-A1B5-1FC2192EB8DE @default.
- Q31150164 P2860 Q31150164-F4B39582-FED1-4179-B4FF-883D95B52169 @default.
- Q31150164 P2860 Q31150164-F869E672-C7DB-47BA-8CDD-F8603F1FB053 @default.
- Q31150164 P304 Q31150164-544FD36C-5396-4F97-9C90-1C8B4D9FD4A9 @default.
- Q31150164 P31 Q31150164-3DF008A2-9462-4DBD-A8B1-536E55390AEC @default.
- Q31150164 P356 Q31150164-65AC60A9-9D43-4459-BCF7-E9BEA5F59F82 @default.
- Q31150164 P433 Q31150164-EA5A06F7-D33D-4B99-8AF8-3693FCD611DC @default.
- Q31150164 P478 Q31150164-2BBEA428-54DF-4BF5-A95A-9E2626B379BC @default.
- Q31150164 P50 Q31150164-3BEE2723-E15B-460D-8660-C7027CE1FDD2 @default.
- Q31150164 P577 Q31150164-B118BF25-30E3-4A48-928E-0C99D5E294C1 @default.
- Q31150164 P698 Q31150164-F4D69B34-413A-48A4-AECF-7548BF785A51 @default.
- Q31150164 P921 Q31150164-7F41ACE3-8937-40A4-AF23-4A7CA61CE8B3 @default.
- Q31150164 P356 S0304-3991(03)00104-9 @default.
- Q31150164 P698 12871804 @default.
- Q31150164 P1433 Q7880603 @default.
- Q31150164 P1476 "Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces" @default.
- Q31150164 P2093 "Walther T" @default.
- Q31150164 P2860 Q30697210 @default.
- Q31150164 P2860 Q30697254 @default.
- Q31150164 P2860 Q56783368 @default.