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- Q33539200 description "1980 nî lūn-bûn" @default.
- Q33539200 description "1980 թուականի Փետրուարին հրատարակուած գիտական յօդուած" @default.
- Q33539200 description "1980 թվականի փետրվարին հրատարակված գիտական հոդված" @default.
- Q33539200 description "1980年の論文" @default.
- Q33539200 description "1980年論文" @default.
- Q33539200 description "1980年論文" @default.
- Q33539200 description "1980年論文" @default.
- Q33539200 description "1980年論文" @default.
- Q33539200 description "1980年論文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980年论文" @default.
- Q33539200 description "1980년 논문" @default.
- Q33539200 description "article científic" @default.
- Q33539200 description "article scientific" @default.
- Q33539200 description "article scientifique (publié 1980)" @default.
- Q33539200 description "articol științific" @default.
- Q33539200 description "articolo scientifico" @default.
- Q33539200 description "artigo científico (publicado na 1980)" @default.
- Q33539200 description "artigo científico (publicado na 1980)" @default.
- Q33539200 description "artigo científico" @default.
- Q33539200 description "artikull shkencor" @default.
- Q33539200 description "artikulong pang-agham" @default.
- Q33539200 description "artykuł naukowy" @default.
- Q33539200 description "artículo científico publicado en 1980" @default.
- Q33539200 description "artículu científicu espublizáu en 1980" @default.
- Q33539200 description "bilimsel makale" @default.
- Q33539200 description "bài báo khoa học" @default.
- Q33539200 description "mokslinis straipsnis" @default.
- Q33539200 description "naučni članak" @default.
- Q33539200 description "scienca artikolo" @default.
- Q33539200 description "scientific article" @default.
- Q33539200 description "teaduslik artikkel" @default.
- Q33539200 description "tieteellinen artikkeli" @default.
- Q33539200 description "tudományos cikk" @default.
- Q33539200 description "vedecký článok" @default.
- Q33539200 description "vetenskaplig artikel" @default.
- Q33539200 description "videnskabelig artikel (udgivet 1980)" @default.
- Q33539200 description "vitenskapelig artikkel" @default.
- Q33539200 description "vitskapeleg artikkel" @default.
- Q33539200 description "vědecký článek" @default.
- Q33539200 description "wetenschappelijk artikel" @default.
- Q33539200 description "wissenschaftlicher Artikel" @default.
- Q33539200 description "επιστημονικό άρθρο" @default.
- Q33539200 description "мақолаи илмӣ" @default.
- Q33539200 description "мақолаи илмӣ" @default.
- Q33539200 description "наукова стаття, опублікована в лютому 1980" @default.
- Q33539200 description "научна статия" @default.
- Q33539200 description "научная статья" @default.
- Q33539200 description "научни чланак" @default.
- Q33539200 description "научни чланак" @default.
- Q33539200 description "מאמר מדעי" @default.
- Q33539200 description "سائنسی مضمون" @default.
- Q33539200 description "مقالة علمية" @default.
- Q33539200 description "مقالهٔ علمی" @default.
- Q33539200 description "১৯৮০-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ" @default.
- Q33539200 description "บทความทางวิทยาศาสตร์" @default.
- Q33539200 description "სამეცნიერო სტატია" @default.
- Q33539200 name "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 name "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 name "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 type Item @default.
- Q33539200 label "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 label "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 label "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 prefLabel "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 prefLabel "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 prefLabel "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 P1433 Q33539200-BF240172-A37E-4A49-BE9C-289ECCF935A0 @default.
- Q33539200 P1476 Q33539200-FAB8D046-2954-4F50-A53C-B327F251B0B5 @default.
- Q33539200 P2093 Q33539200-D79D3965-05C5-46AE-A0BE-C31C1AE3756C @default.
- Q33539200 P2093 Q33539200-FDC3A8EA-4984-46EC-96B0-5739DC3C4E11 @default.
- Q33539200 P304 Q33539200-E4F827DE-2530-4AC1-A82B-D204695DE3F5 @default.
- Q33539200 P31 Q33539200-5F5E3561-874C-4A4B-A70A-DB2DFF7614E3 @default.
- Q33539200 P356 Q33539200-B1A98827-EC49-4A80-96BF-CFB33191B557 @default.
- Q33539200 P407 Q33539200-DB1630B5-C431-4925-8CE1-B8F9E2D1921C @default.
- Q33539200 P433 Q33539200-9571D9DB-A7CD-4236-9170-BE810A765648 @default.
- Q33539200 P478 Q33539200-06C3403B-24A1-476C-B746-6BD5B8C7AA08 @default.
- Q33539200 P577 Q33539200-5B85ED6D-FD1C-4FD4-87B1-E662A58D990B @default.
- Q33539200 P698 Q33539200-7E7F8967-867F-4911-86FB-B96B392E8EC8 @default.
- Q33539200 P819 Q33539200-2C3EEF56-D438-4836-96E2-D6D64F951391 @default.
- Q33539200 P356 AO.19.000525 @default.
- Q33539200 P698 20216888 @default.
- Q33539200 P1433 Q4781557 @default.
- Q33539200 P1476 "Linewidth measurement on IC masks and wafers by grating test patterns" @default.
- Q33539200 P2093 "H Meier" @default.
- Q33539200 P2093 "H P Kleinknecht" @default.
- Q33539200 P304 "525-533" @default.
- Q33539200 P31 Q13442814 @default.
- Q33539200 P356 "10.1364/AO.19.000525" @default.
- Q33539200 P407 Q1860 @default.
- Q33539200 P433 "4" @default.
- Q33539200 P478 "19" @default.
- Q33539200 P577 "1980-02-01T00:00:00Z" @default.
- Q33539200 P698 "20216888" @default.
- Q33539200 P819 "1980ApOpt..19..525K" @default.