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- Q33783625 description "2010 nî lūn-bûn" @default.
- Q33783625 description "2010 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած" @default.
- Q33783625 description "2010 թվականի դեկտեմբերին հրատարակված գիտական հոդված" @default.
- Q33783625 description "2010年の論文" @default.
- Q33783625 description "2010年論文" @default.
- Q33783625 description "2010年論文" @default.
- Q33783625 description "2010年論文" @default.
- Q33783625 description "2010年論文" @default.
- Q33783625 description "2010年論文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010年论文" @default.
- Q33783625 description "2010년 논문" @default.
- Q33783625 description "article científic" @default.
- Q33783625 description "article scientific" @default.
- Q33783625 description "article scientifique (publié 2010)" @default.
- Q33783625 description "articol științific" @default.
- Q33783625 description "articolo scientifico" @default.
- Q33783625 description "artigo científico (publicado na 2010)" @default.
- Q33783625 description "artigo científico (publicado na 2010)" @default.
- Q33783625 description "artigo científico" @default.
- Q33783625 description "artikull shkencor" @default.
- Q33783625 description "artikulong pang-agham" @default.
- Q33783625 description "artykuł naukowy" @default.
- Q33783625 description "artículo científico publicado en 2010" @default.
- Q33783625 description "artículu científicu espublizáu en 2010" @default.
- Q33783625 description "bilimsel makale" @default.
- Q33783625 description "bài báo khoa học" @default.
- Q33783625 description "mokslinis straipsnis" @default.
- Q33783625 description "naučni članak" @default.
- Q33783625 description "scienca artikolo" @default.
- Q33783625 description "scientific article" @default.
- Q33783625 description "teaduslik artikkel" @default.
- Q33783625 description "tieteellinen artikkeli" @default.
- Q33783625 description "tudományos cikk" @default.
- Q33783625 description "vedecký článok" @default.
- Q33783625 description "vetenskaplig artikel" @default.
- Q33783625 description "videnskabelig artikel (udgivet 2010)" @default.
- Q33783625 description "vitenskapelig artikkel" @default.
- Q33783625 description "vitskapeleg artikkel" @default.
- Q33783625 description "vědecký článek" @default.
- Q33783625 description "wetenschappelijk artikel" @default.
- Q33783625 description "wissenschaftlicher Artikel" @default.
- Q33783625 description "επιστημονικό άρθρο" @default.
- Q33783625 description "мақолаи илмӣ" @default.
- Q33783625 description "мақолаи илмӣ" @default.
- Q33783625 description "наукова стаття, опублікована в грудні 2010" @default.
- Q33783625 description "научна статия" @default.
- Q33783625 description "научная статья" @default.
- Q33783625 description "научни чланак" @default.
- Q33783625 description "научни чланак" @default.
- Q33783625 description "מאמר מדעי" @default.
- Q33783625 description "سائنسی مضمون" @default.
- Q33783625 description "مقالة علمية" @default.
- Q33783625 description "مقالهٔ علمی" @default.
- Q33783625 description "২০১০-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ" @default.
- Q33783625 description "บทความทางวิทยาศาสตร์" @default.
- Q33783625 description "სამეცნიერო სტატია" @default.
- Q33783625 name "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
- Q33783625 name "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
- Q33783625 name "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
- Q33783625 type Item @default.
- Q33783625 label "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
- Q33783625 label "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
- Q33783625 label "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
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- Q33783625 prefLabel "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization." @default.
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- Q33783625 P1476 "Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization" @default.
- Q33783625 P2093 "Akifumi Fujimoto" @default.
- Q33783625 P2093 "Atsushi Hosoi" @default.
- Q33783625 P2093 "Lan Zhang" @default.