Matches in Wikidata for { <http://www.wikidata.org/entity/Q35600798> ?p ?o ?g. }
- Q35600798 description "2015 nî lūn-bûn" @default.
- Q35600798 description "2015年の論文" @default.
- Q35600798 description "2015年論文" @default.
- Q35600798 description "2015年論文" @default.
- Q35600798 description "2015年論文" @default.
- Q35600798 description "2015年論文" @default.
- Q35600798 description "2015年論文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015年论文" @default.
- Q35600798 description "2015년 논문" @default.
- Q35600798 description "article científic" @default.
- Q35600798 description "article scientific" @default.
- Q35600798 description "article scientifique" @default.
- Q35600798 description "articol științific" @default.
- Q35600798 description "articolo scientifico" @default.
- Q35600798 description "artigo científico" @default.
- Q35600798 description "artigo científico" @default.
- Q35600798 description "artigo científico" @default.
- Q35600798 description "artikel ilmiah" @default.
- Q35600798 description "artikull shkencor" @default.
- Q35600798 description "artikulong pang-agham" @default.
- Q35600798 description "artykuł naukowy" @default.
- Q35600798 description "artículo científico publicado en 2015" @default.
- Q35600798 description "artículu científicu espublizáu en 2015" @default.
- Q35600798 description "bilimsel makale" @default.
- Q35600798 description "bài báo khoa học" @default.
- Q35600798 description "naučni članak" @default.
- Q35600798 description "scienca artikolo" @default.
- Q35600798 description "scientific article published on 28 April 2015" @default.
- Q35600798 description "scientific article published on 28 April 2015" @default.
- Q35600798 description "scientific article published on 28 April 2015" @default.
- Q35600798 description "teaduslik artikkel" @default.
- Q35600798 description "tieteellinen artikkeli" @default.
- Q35600798 description "tudományos cikk" @default.
- Q35600798 description "vedecký článok" @default.
- Q35600798 description "vetenskaplig artikel" @default.
- Q35600798 description "videnskabelig artikel" @default.
- Q35600798 description "vitenskapelig artikkel" @default.
- Q35600798 description "vitskapeleg artikkel" @default.
- Q35600798 description "vědecký článek" @default.
- Q35600798 description "wetenschappelijk artikel" @default.
- Q35600798 description "wissenschaftlicher Artikel" @default.
- Q35600798 description "επιστημονικό άρθρο" @default.
- Q35600798 description "мақолаи илмӣ" @default.
- Q35600798 description "наукова стаття, опублікована у квітні 2015" @default.
- Q35600798 description "научна статия" @default.
- Q35600798 description "научная статья" @default.
- Q35600798 description "научни чланак" @default.
- Q35600798 description "научни чланак" @default.
- Q35600798 description "מאמר מדעי" @default.
- Q35600798 description "مقالة علمية نشرت في 28 أبريل 2015" @default.
- Q35600798 description "২৮ এপ্রিল ২০১৫-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ" @default.
- Q35600798 description "บทความทางวิทยาศาสตร์" @default.
- Q35600798 description "სამეცნიერო სტატია" @default.
- Q35600798 name "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 name "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 name "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 type Item @default.
- Q35600798 label "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 label "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 label "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 prefLabel "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 prefLabel "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 prefLabel "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 P1433 Q35600798-3F28B76C-EE5D-418C-A1C3-4758450D0E6A @default.
- Q35600798 P1476 Q35600798-6D3570B6-1D8D-49DC-88E6-939BD2359EA0 @default.
- Q35600798 P2093 Q35600798-2AD8DEC2-9C96-4216-9871-846A8900640C @default.
- Q35600798 P2093 Q35600798-51BC9B7F-129A-43EC-ADD7-9C627A7DDEE4 @default.
- Q35600798 P2093 Q35600798-5E7058CA-4652-4C8D-B758-E8E98745D885 @default.
- Q35600798 P2093 Q35600798-68277181-4C08-4273-89A6-B6855A3402D2 @default.
- Q35600798 P2093 Q35600798-685171EA-7DA4-40ED-BC15-415C8160B06C @default.
- Q35600798 P2093 Q35600798-69CACC42-F19E-4FC1-98CF-4787267D4E92 @default.
- Q35600798 P2093 Q35600798-81B58AA2-287B-4E0F-96D0-E63FB8F0658A @default.
- Q35600798 P2093 Q35600798-A0E72036-3B8E-49FE-94D0-D15B196B7BE6 @default.
- Q35600798 P2093 Q35600798-C395E77D-4069-4CC3-A28C-7127198B8094 @default.
- Q35600798 P2093 Q35600798-CD653E75-F2A3-4988-A87E-85C8E65B07A6 @default.
- Q35600798 P304 Q35600798-F3F5E54F-C7AF-42D9-B71D-1AA0EC92697E @default.
- Q35600798 P31 Q35600798-C3FA57E8-1916-45E9-8431-73AA639743E2 @default.
- Q35600798 P356 Q35600798-3CB72BAB-678A-4C76-8BA8-DA16E639006B @default.
- Q35600798 P407 Q35600798-CF05167F-522A-4F52-B72F-B4A5B90E2569 @default.
- Q35600798 P433 Q35600798-E03CCCFE-6023-44B7-930C-283AE1037780 @default.
- Q35600798 P478 Q35600798-FA0F26AB-98DE-4B5B-9342-08D159A2C9A6 @default.
- Q35600798 P50 Q35600798-76FD75F7-75D9-4476-85EF-0F02A2BC5DCC @default.
- Q35600798 P50 Q35600798-7EC4EB98-8C33-44B5-82BC-5B0D4E7610A4 @default.
- Q35600798 P50 Q35600798-84647826-1A72-470E-89EC-2089A92BA04F @default.
- Q35600798 P577 Q35600798-C056A29C-5676-4A37-9313-00180E7B336E @default.
- Q35600798 P698 Q35600798-B5C343E4-A36A-46DA-A0FF-148B8B017686 @default.
- Q35600798 P921 Q35600798-5818F6A9-7B95-41CB-91A2-381B1C3F98EE @default.
- Q35600798 P356 AM508968B @default.
- Q35600798 P698 25871429 @default.
- Q35600798 P1433 Q2819060 @default.
- Q35600798 P1476 "Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy" @default.
- Q35600798 P2093 "Anna Marzegalli" @default.
- Q35600798 P2093 "Christian Reich" @default.
- Q35600798 P2093 "Gilbert A Chahine" @default.
- Q35600798 P2093 "Maik Häberlen" @default.