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Matches in Wikidata for { <http://www.wikidata.org/entity/Q44368192> ?p ?o ?g. }

• Q44368192 description "2013 nî lūn-bûn" @default.
• Q44368192 description "2013年の論文" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年学术文章" @default.
• Q44368192 description "2013年學術文章" @default.
• Q44368192 description "2013年學術文章" @default.
• Q44368192 description "2013年學術文章" @default.
• Q44368192 description "2013年學術文章" @default.
• Q44368192 description "2013年學術文章" @default.
• Q44368192 description "2013년 논문" @default.
• Q44368192 description "article científic" @default.
• Q44368192 description "article scientific" @default.
• Q44368192 description "article scientifique" @default.
• Q44368192 description "articol științific" @default.
• Q44368192 description "articolo scientifico" @default.
• Q44368192 description "artigo científico" @default.
• Q44368192 description "artigo científico" @default.
• Q44368192 description "artigo científico" @default.
• Q44368192 description "artikel ilmiah" @default.
• Q44368192 description "artikull shkencor" @default.
• Q44368192 description "artikulong pang-agham" @default.
• Q44368192 description "artykuł naukowy" @default.
• Q44368192 description "artículo científico publicado en 2013" @default.
• Q44368192 description "artículu científicu" @default.
• Q44368192 description "bilimsel makale" @default.
• Q44368192 description "bài báo khoa học" @default.
• Q44368192 description "naučni članak" @default.
• Q44368192 description "scienca artikolo" @default.
• Q44368192 description "scientific article published on 29 August 2013" @default.
• Q44368192 description "scientific article published on 29 August 2013" @default.
• Q44368192 description "scientific article published on 29 August 2013" @default.
• Q44368192 description "teaduslik artikkel" @default.
• Q44368192 description "tieteellinen artikkeli" @default.
• Q44368192 description "tudományos cikk" @default.
• Q44368192 description "vedecký článok" @default.
• Q44368192 description "vetenskaplig artikel" @default.
• Q44368192 description "videnskabelig artikel" @default.
• Q44368192 description "vitenskapelig artikkel" @default.
• Q44368192 description "vitskapeleg artikkel" @default.
• Q44368192 description "vědecký článek" @default.
• Q44368192 description "wetenschappelijk artikel" @default.
• Q44368192 description "wissenschaftlicher Artikel" @default.
• Q44368192 description "επιστημονικό άρθρο" @default.
• Q44368192 description "мақолаи илмӣ" @default.
• Q44368192 description "наукова стаття, опублікована в серпні 2013" @default.
• Q44368192 description "научна статия" @default.
• Q44368192 description "научная статья" @default.
• Q44368192 description "научни чланак" @default.
• Q44368192 description "научни чланак" @default.
• Q44368192 description "מאמר מדעי" @default.
• Q44368192 description "مقالة علمية نشرت في 29 أغسطس 2013" @default.
• Q44368192 description "২৯ আগস্ট ২০১৩-এ প্রকাশিত বৈজ্ঞানিক নিবন্ধ" @default.
• Q44368192 description "บทความทางวิทยาศาสตร์" @default.
• Q44368192 description "სამეცნიერო სტატია" @default.
• Q44368192 name "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 name "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 type Item @default.
• Q44368192 label "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 label "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 prefLabel "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 prefLabel "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
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• Q44368192 P1476 "Charge trapping states at the SiO2-oligothiophene monolayer interface in field effect transistors studied by Kelvin probe force microscopy" @default.
• Q44368192 P2093 "Dominik Ziegler" @default.
• Q44368192 P2093 "Yingjie Zhang" @default.
• Q44368192 P304 "8258-8265" @default.
• Q44368192 P31 Q13442814 @default.
• Q44368192 P356 "10.1021/NN403750H" @default.
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• Q44368192 P577 "2013-08-29T00:00:00Z" @default.
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