Matches in Wikidata for { <http://www.wikidata.org/entity/Q56429701> ?p ?o ?g. }
Showing items 1 to 40 of
40
with 100 items per page.
- Q56429701 description "article scientifique publié en 1995" @default.
- Q56429701 description "im März 1995 veröffentlichter wissenschaftlicher Artikel" @default.
- Q56429701 description "wetenschappelijk artikel" @default.
- Q56429701 description "наукова стаття, опублікована в березні 1995" @default.
- Q56429701 name "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 name "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 type Item @default.
- Q56429701 label "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 label "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 prefLabel "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 prefLabel "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 P1433 Q56429701-21929786-EFA5-4783-8A73-B4847D8423AE @default.
- Q56429701 P1476 Q56429701-450598CC-60B0-487C-9360-B0BD53BCE59A @default.
- Q56429701 P2093 Q56429701-170C6C68-40AC-4CD6-AFEF-1C9C96A22B0D @default.
- Q56429701 P2093 Q56429701-77280A60-E66B-4B12-9BBD-89F34AB60315 @default.
- Q56429701 P2093 Q56429701-88FACA31-E896-472D-9D6F-813220C1D29C @default.
- Q56429701 P2093 Q56429701-92557D40-D050-4C55-85ED-CC65D28AE5B4 @default.
- Q56429701 P2093 Q56429701-A2605A23-EDB1-4E2E-9C14-6070FCCECDCB @default.
- Q56429701 P304 Q56429701-54A7CFD9-9BB2-47EA-A947-62A6D11A6CE9 @default.
- Q56429701 P31 Q56429701-7D03A534-6B37-46BB-BB77-E6DD668CE817 @default.
- Q56429701 P356 Q56429701-78E220FD-D62C-42C2-94CD-A3AE002ED651 @default.
- Q56429701 P407 Q56429701-1AEB2CA1-E6AC-483F-A746-C0B78EB2AFBC @default.
- Q56429701 P433 Q56429701-7D983B4B-A805-470C-A389-1AA0CD31427D @default.
- Q56429701 P478 Q56429701-0BEAC285-0F59-4091-BD86-260FB1451163 @default.
- Q56429701 P577 Q56429701-AE09BC16-F64D-4DFE-AAF3-F262326D81DC @default.
- Q56429701 P356 1.113636 @default.
- Q56429701 P1433 Q621615 @default.
- Q56429701 P1476 "Characterization of a point‐contact on silicon using force microscopy‐supported resistance measurements" @default.
- Q56429701 P2093 "J. Snauwaert" @default.
- Q56429701 P2093 "L. Hellemans" @default.
- Q56429701 P2093 "P. De Wolf" @default.
- Q56429701 P2093 "T. Clarysse" @default.
- Q56429701 P2093 "W. Vandervorst" @default.
- Q56429701 P304 "1530-1532" @default.
- Q56429701 P31 Q13442814 @default.
- Q56429701 P356 "10.1063/1.113636" @default.
- Q56429701 P407 Q1860 @default.
- Q56429701 P433 "12" @default.
- Q56429701 P478 "66" @default.
- Q56429701 P577 "1995-03-20T00:00:00Z" @default.