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- Q57387107 description "article by Craig M. Polley et al published 24 December 2012 in Applied Physics Letters" @default.
- Q57387107 description "im Dezember 2012 veröffentlichter wissenschaftlicher Artikel" @default.
- Q57387107 description "wetenschappelijk artikel" @default.
- Q57387107 description "наукова стаття, опублікована в грудні 2012" @default.
- Q57387107 name "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
- Q57387107 name "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
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- Q57387107 label "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
- Q57387107 label "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
- Q57387107 prefLabel "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
- Q57387107 prefLabel "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
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- Q57387107 P1476 "Microscopic four-point-probe resistivity measurements of shallow, high density doping layers in silicon" @default.
- Q57387107 P2093 "Craig M. Polley" @default.
- Q57387107 P2093 "Jill A. Miwa" @default.
- Q57387107 P2093 "Justin W. Wells" @default.
- Q57387107 P2093 "Warrick R. Clarke" @default.
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