Matches in Wikidata for { <http://www.wikidata.org/entity/Q57390447> ?p ?o ?g. }
Showing items 1 to 36 of
36
with 100 items per page.
- Q57390447 description "article" @default.
- Q57390447 description "im Dezember 2010 veröffentlichter wissenschaftlicher Artikel" @default.
- Q57390447 description "wetenschappelijk artikel" @default.
- Q57390447 description "наукова стаття, опублікована в грудні 2010" @default.
- Q57390447 name "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 name "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 type Item @default.
- Q57390447 label "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 label "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 prefLabel "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 prefLabel "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 P1433 Q57390447-08ABA9C7-757F-430B-83FD-18EEA2776F0B @default.
- Q57390447 P1476 Q57390447-3131F4ED-054A-4677-B033-7F2A3BDB1206 @default.
- Q57390447 P2093 Q57390447-238493C0-118E-4D11-BC21-5C85A101E525 @default.
- Q57390447 P2093 Q57390447-33055202-61E3-48A0-9107-C666BE0E6F93 @default.
- Q57390447 P304 Q57390447-45152404-AF44-4BA1-B8F2-AFE2B2D5B1F7 @default.
- Q57390447 P31 Q57390447-E85EE9B6-3104-412C-94CE-4940A18BD20F @default.
- Q57390447 P356 Q57390447-C6A62766-DA4E-4FB1-9DB3-5F2C713B7897 @default.
- Q57390447 P478 Q57390447-76ADBD8C-26B4-4842-B9C8-1617539E1586 @default.
- Q57390447 P50 Q57390447-CB48B009-071D-480F-B15C-66BA44EAAA44 @default.
- Q57390447 P577 Q57390447-93C99B79-EAF1-4371-92AF-351EE2538F42 @default.
- Q57390447 P921 Q57390447-437D14D8-A719-4D59-B2A8-FF77FA3D5430 @default.
- Q57390447 P921 Q57390447-CD0C482A-CF65-4AA6-875C-5C70BD07C2A0 @default.
- Q57390447 P356 JNANOR.12.45 @default.
- Q57390447 P1433 Q15816817 @default.
- Q57390447 P1476 "Forward Bias Capacitance-Voltage Measurements on Semiconductors Using Co-Planar Ohmic and Schottky Contacts in a Cylindrical Geometry" @default.
- Q57390447 P2093 "Markku Sopanen" @default.
- Q57390447 P2093 "Victor Tapio Rangel-Kuoppa" @default.
- Q57390447 P304 "45-54" @default.
- Q57390447 P31 Q13442814 @default.
- Q57390447 P356 "10.4028/WWW.SCIENTIFIC.NET/JNANOR.12.45" @default.
- Q57390447 P478 "12" @default.
- Q57390447 P50 Q51153217 @default.
- Q57390447 P577 "2010-12-01T00:00:00Z" @default.
- Q57390447 P921 Q11456 @default.
- Q57390447 P921 Q742736 @default.