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- Q57549911 description "im April 2015 veröffentlichter wissenschaftlicher Artikel" @default.
- Q57549911 description "wetenschappelijk artikel" @default.
- Q57549911 description "наукова стаття, опублікована у квітні 2015" @default.
- Q57549911 name "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 name "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 type Item @default.
- Q57549911 label "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 label "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 prefLabel "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 prefLabel "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 P1433 Q57549911-FCD35A62-07E5-46DC-8C8F-9D9B3A81B5CD @default.
- Q57549911 P1476 Q57549911-31C866C2-26EE-4892-9F60-C3809F66C8EE @default.
- Q57549911 P2093 Q57549911-0CE6EC46-11BD-41F3-8F61-B2AB7217188D @default.
- Q57549911 P2093 Q57549911-48CE78C0-2656-402F-8E7D-354FA9DFF442 @default.
- Q57549911 P2093 Q57549911-6A89CFE1-B87F-4788-B081-DF4339F80AD0 @default.
- Q57549911 P2093 Q57549911-8E1CB6E9-B432-474E-95F6-5DE74A58302D @default.
- Q57549911 P2888 Q57549911-CC3EBCFA-E846-4887-BF1A-47E93B310FA3 @default.
- Q57549911 P304 Q57549911-96EAC796-3A89-4927-A201-C2869ED43748 @default.
- Q57549911 P31 Q57549911-B04FE810-2E31-4D1E-AD25-E90B6B987438 @default.
- Q57549911 P356 Q57549911-61372C76-1BE1-4BFB-B3C2-CF77BBACA8C8 @default.
- Q57549911 P433 Q57549911-DD97BB95-1523-4198-9F43-1FB1F8D3D522 @default.
- Q57549911 P478 Q57549911-88C58040-C59A-45C2-902A-E558ED301BF4 @default.
- Q57549911 P50 Q57549911-E888D37B-6A0A-4348-B272-85105773AB97 @default.
- Q57549911 P577 Q57549911-04B028C6-4516-4537-861F-9107EFB63BAA @default.
- Q57549911 P356 S11434-015-0774-3 @default.
- Q57549911 P1433 Q5100608 @default.
- Q57549911 P1476 "Optical contrast determination of the thickness of SiO 2 film on Si substrate partially covered by two-dimensional crystal flakes" @default.
- Q57549911 P2093 "Jiang-Bin Wu" @default.
- Q57549911 P2093 "Xiao-Li Li" @default.
- Q57549911 P2093 "Xin Zhang" @default.
- Q57549911 P2093 "Yan Lu" @default.
- Q57549911 P2888 s11434-015-0774-3 @default.
- Q57549911 P304 "806-811" @default.
- Q57549911 P31 Q13442814 @default.
- Q57549911 P356 "10.1007/S11434-015-0774-3" @default.
- Q57549911 P433 "8" @default.
- Q57549911 P478 "60" @default.
- Q57549911 P50 Q42703661 @default.
- Q57549911 P577 "2015-04-01T00:00:00Z" @default.