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- Q57554495 description "article scientifique publié en 2002" @default.
- Q57554495 description "article" @default.
- Q57554495 description "im Januar 2002 veröffentlichter wissenschaftlicher Artikel" @default.
- Q57554495 description "wetenschappelijk artikel" @default.
- Q57554495 description "наукова стаття, опублікована у 2002" @default.
- Q57554495 name "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 name "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 type Item @default.
- Q57554495 label "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 label "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 prefLabel "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 prefLabel "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
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- Q57554495 P356 16.974753 @default.
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- Q57554495 P1476 "A method to extract mobility degradation and total series resistance of fully-depleted SOI MOSFETs" @default.
- Q57554495 P2093 "A. Cerdeira" @default.
- Q57554495 P2093 "F.J.G. Sanchez" @default.
- Q57554495 P2093 "J.J. Liou" @default.
- Q57554495 P2093 "M. Estrada" @default.
- Q57554495 P304 "82-88" @default.
- Q57554495 P31 Q13442814 @default.
- Q57554495 P356 "10.1109/16.974753" @default.
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- Q57554495 P577 "2002-01-01T00:00:00Z" @default.