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- Q57774848 description "im Oktober 2014 veröffentlichter wissenschaftlicher Artikel" @default.
- Q57774848 description "wetenschappelijk artikel" @default.
- Q57774848 description "наукова стаття, опублікована в жовтні 2014" @default.
- Q57774848 name "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
- Q57774848 name "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
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- Q57774848 label "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
- Q57774848 label "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
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- Q57774848 prefLabel "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
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- Q57774848 P1476 "Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by a steady-state photocapacitance method" @default.
- Q57774848 P2093 "Akimasa Yamada" @default.
- Q57774848 P2093 "Katsuhiro Akimoto" @default.
- Q57774848 P2093 "Shogo Ishizuka" @default.
- Q57774848 P2093 "Sigeru Niki" @default.
- Q57774848 P2093 "Takeaki Sakurai" @default.
- Q57774848 P2093 "Xiaobo Hu" @default.
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