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- Q57832318 description "article scientifique publié en 2004" @default.
- Q57832318 description "im Juli 2004 veröffentlicher wissenschaftlicher Artikel" @default.
- Q57832318 description "wetenschappelijk artikel" @default.
- Q57832318 description "наукова стаття, опублікована в липні 2004" @default.
- Q57832318 name "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 name "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 type Item @default.
- Q57832318 label "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 label "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 prefLabel "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 prefLabel "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 P1433 Q57832318-A01E0820-DA88-4078-93CB-DFAE092498B9 @default.
- Q57832318 P1476 Q57832318-4C75EED2-FA1E-4B2F-A845-FC13E11B396C @default.
- Q57832318 P2093 Q57832318-0F586E6E-1611-4B08-860E-C5CCC56E09BE @default.
- Q57832318 P2093 Q57832318-27B09394-38CD-487A-A3B3-FB1EA20B4D1C @default.
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- Q57832318 P2093 Q57832318-4A34A930-B592-4AD2-A11C-8685306CAF00 @default.
- Q57832318 P2093 Q57832318-6AEF18CD-CB74-4C86-B3CF-91C3335749AC @default.
- Q57832318 P2093 Q57832318-95DAEBA9-CBA8-4ADC-8D96-51D061F5D6C5 @default.
- Q57832318 P2093 Q57832318-B61D8540-44EF-4A84-B199-05D40FB79353 @default.
- Q57832318 P2093 Q57832318-E8FBBD87-56FA-4B8B-AD6D-728867C7E910 @default.
- Q57832318 P304 Q57832318-624D1F05-3E2F-4F8D-845E-BB514B5B8015 @default.
- Q57832318 P31 Q57832318-E0EE4F4D-F28F-4556-BE62-A8567F31BA4C @default.
- Q57832318 P356 Q57832318-F65E51EC-C8BE-4DDC-B3F0-5514135D70A2 @default.
- Q57832318 P433 Q57832318-37ACD0F5-7CA8-4025-9755-507125FDCDD8 @default.
- Q57832318 P478 Q57832318-2FE52EDF-427F-4A36-8746-4A95DBA94DB8 @default.
- Q57832318 P577 Q57832318-2C51DB39-524C-4261-82E6-8A93917C320F @default.
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- Q57832318 P921 Q57832318-D357BA70-62F1-496D-BCF2-07FA96C607CF @default.
- Q57832318 P356 001 @default.
- Q57832318 P1433 Q15708793 @default.
- Q57832318 P1476 "Characterization of sputtering deposited NiTi shape memory thin films using a temperature controllable atomic force microscope" @default.
- Q57832318 P2093 "F Chellet" @default.
- Q57832318 P2093 "H J Du" @default.
- Q57832318 P2093 "M H Hong" @default.
- Q57832318 P2093 "M J Wu" @default.
- Q57832318 P2093 "Q He" @default.
- Q57832318 P2093 "T C Chong" @default.
- Q57832318 P2093 "W M Huang" @default.
- Q57832318 P2093 "Y Q Fu" @default.
- Q57832318 P304 "977-982" @default.
- Q57832318 P31 Q13442814 @default.
- Q57832318 P356 "10.1088/0964-1726/13/5/001" @default.
- Q57832318 P433 "5" @default.
- Q57832318 P478 "13" @default.
- Q57832318 P577 "2004-07-02T00:00:00Z" @default.
- Q57832318 P921 Q1137203 @default.
- Q57832318 P921 Q98108574 @default.