Matches in Wikidata for { <http://www.wikidata.org/entity/Q58279602> ?p ?o ?g. }
Showing items 1 to 35 of
35
with 100 items per page.
- Q58279602 description "im September 2006 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58279602 description "wetenschappelijk artikel" @default.
- Q58279602 description "наукова стаття, опублікована у вересні 2006" @default.
- Q58279602 name "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 name "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 type Item @default.
- Q58279602 label "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 label "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 prefLabel "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 prefLabel "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 P1433 Q58279602-7A1CB4F2-2011-4F0A-A42B-A27876CBF9AF @default.
- Q58279602 P1476 Q58279602-14FB735D-9F5E-44C9-91CA-96D7F797A54F @default.
- Q58279602 P2093 Q58279602-549F51F2-C768-48AF-B175-990450F7EB3B @default.
- Q58279602 P2093 Q58279602-741C0D11-08CB-41F0-99C3-D340B1318095 @default.
- Q58279602 P304 Q58279602-AB85B969-F832-4EDC-A062-39DF62913CAC @default.
- Q58279602 P31 Q58279602-BA1EDEEC-D92D-4B97-9211-8F5EA0708E95 @default.
- Q58279602 P356 Q58279602-3B7F0ABB-13F5-4253-B3F8-26150948F770 @default.
- Q58279602 P433 Q58279602-B82114EC-3676-4579-ADD9-E98958FEB711 @default.
- Q58279602 P478 Q58279602-FD3A372E-B8DA-4762-825D-75F9CA7AE883 @default.
- Q58279602 P50 Q58279602-00279DB7-14CC-477D-8AD4-D1E4BD63FF66 @default.
- Q58279602 P50 Q58279602-645553CC-AE73-43FA-AA87-318AE576DB20 @default.
- Q58279602 P577 Q58279602-6E61AC2E-D084-4E8A-BF92-9AE5F5A3911D @default.
- Q58279602 P356 J.DIAMOND.2005.10.001 @default.
- Q58279602 P1433 Q15757085 @default.
- Q58279602 P1476 "Depth profiles of the Fermi level at an amorphous-carbon nitride/SiO2/n-type-Si heterojunction interface obtained by Kelvin probe force microscopy" @default.
- Q58279602 P2093 "Osamu Takai" @default.
- Q58279602 P2093 "Takahiro Ishizaki" @default.
- Q58279602 P304 "1378-1382" @default.
- Q58279602 P31 Q13442814 @default.
- Q58279602 P356 "10.1016/J.DIAMOND.2005.10.001" @default.
- Q58279602 P433 "9" @default.
- Q58279602 P478 "15" @default.
- Q58279602 P50 Q39399880 @default.
- Q58279602 P50 Q57475869 @default.
- Q58279602 P577 "2006-09-01T00:00:00Z" @default.