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- Q58292534 description "article scientifique publié en janvier 2001" @default.
- Q58292534 description "im Januar 2001 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58292534 description "journal article; published in Advanced Composite Materials in 2001" @default.
- Q58292534 description "journal article; published in Advanced Composite Materials in 2001" @default.
- Q58292534 description "journal article; published in Advanced Composite Materials in 2001" @default.
- Q58292534 description "wetenschappelijk artikel" @default.
- Q58292534 description "наукова стаття, опублікована в січні 2001" @default.
- Q58292534 name "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 name "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 name "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 name "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite" @default.
- Q58292534 type Item @default.
- Q58292534 label "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 label "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 label "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 label "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite" @default.
- Q58292534 prefLabel "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 prefLabel "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 prefLabel "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 prefLabel "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite" @default.
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- Q58292534 P304 Q58292534-4251A567-AEE9-454F-9008-42702B2EA506 @default.
- Q58292534 P31 Q58292534-021C596C-9A3A-4DAF-B08A-C9375732A864 @default.
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- Q58292534 P433 Q58292534-20418E24-8BDA-42A0-A26D-6301D69225C7 @default.
- Q58292534 P478 Q58292534-B80A480E-1154-4FC8-BB66-48253BF02D7F @default.
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- Q58292534 P921 Q58292534-4ED546A4-C2E2-402C-A368-7C4F1429B79F @default.
- Q58292534 P356 156855101753415382 @default.
- Q58292534 P1433 Q4686156 @default.
- Q58292534 P1476 "Scanning electron microscopy study of failure in glass-sealed SiC/SiC-based composite (NUSK-CMC) creep tested at 1100 and 1200°C in air" @default.
- Q58292534 P2093 "I. J. Davies" @default.
- Q58292534 P2093 "T. Ishikawa" @default.
- Q58292534 P2093 "T. Ogasawara" @default.
- Q58292534 P2860 Q58246731 @default.
- Q58292534 P304 "357-367" @default.
- Q58292534 P31 Q13442814 @default.
- Q58292534 P356 "10.1163/156855101753415382" @default.
- Q58292534 P433 "4" @default.
- Q58292534 P478 "10" @default.
- Q58292534 P577 "2001-01-01T00:00:00Z" @default.
- Q58292534 P856 156855101753415382 @default.
- Q58292534 P921 Q181790 @default.