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- Q58324582 description "artículu científicu" @default.
- Q58324582 description "im April 2008 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58324582 description "wetenschappelijk artikel" @default.
- Q58324582 description "наукова стаття, опублікована у квітні 2008" @default.
- Q58324582 name "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 name "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 type Item @default.
- Q58324582 label "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 label "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 prefLabel "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 prefLabel "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
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- Q58324582 P2093 Q58324582-9A614FC4-AFCB-480D-A6FE-8FFA42C5508E @default.
- Q58324582 P2093 Q58324582-A0AAC9DF-9134-4BCA-B5C5-C2E61FC7803D @default.
- Q58324582 P304 Q58324582-45391E61-91DF-4299-A30C-CB69BA67F8E5 @default.
- Q58324582 P31 Q58324582-79B28B24-9842-4A50-98DD-232AFBFD81F4 @default.
- Q58324582 P356 Q58324582-0498D14E-2887-49ED-864B-F85AADD04297 @default.
- Q58324582 P433 Q58324582-4F4E290F-9708-455F-A25D-EF7B58371B74 @default.
- Q58324582 P4510 Q58324582-78B7568D-E4E2-41D4-86EE-F3E236D514D0 @default.
- Q58324582 P478 Q58324582-94699C4A-7595-46F8-98FF-47C93B6447B5 @default.
- Q58324582 P577 Q58324582-507F9F5C-1260-46ED-950E-10E71ECACE55 @default.
- Q58324582 P921 Q58324582-E2523ED0-73B0-449F-BEE6-1B8FECF63176 @default.
- Q58324582 P356 2008-01-0697 @default.
- Q58324582 P1433 Q15760772 @default.
- Q58324582 P1476 "Study of Stress Measurements Technique for Internal Electrical Connection of Printed Circuit Boards using Synchrotron Radiation" @default.
- Q58324582 P2093 "Hiromitsu Asai" @default.
- Q58324582 P2093 "Keisuke Tanaka" @default.
- Q58324582 P2093 "Susumu Miyakawa" @default.
- Q58324582 P2093 "Toshimasa Ito" @default.
- Q58324582 P2093 "Yoshiaki Akiniwa" @default.
- Q58324582 P304 "291-298" @default.
- Q58324582 P31 Q13442814 @default.
- Q58324582 P356 "10.4271/2008-01-0697" @default.
- Q58324582 P433 "1" @default.
- Q58324582 P4510 Q212871 @default.
- Q58324582 P478 "1" @default.
- Q58324582 P577 "2008-04-14T00:00:00Z" @default.
- Q58324582 P921 Q212871 @default.