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- Q58435335 description "im November 2005 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58435335 description "wetenschappelijk artikel" @default.
- Q58435335 description "наукова стаття, опублікована в листопаді 2005" @default.
- Q58435335 name "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 name "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 type Item @default.
- Q58435335 label "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 label "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 prefLabel "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 prefLabel "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 P1433 Q58435335-0AF4FCCE-20EF-4482-BA2A-C561FE3E3186 @default.
- Q58435335 P1476 Q58435335-D76D55EE-6F28-4575-97B6-A017A669554F @default.
- Q58435335 P2093 Q58435335-ADBAFEC8-9072-4997-A765-F4429503D3DF @default.
- Q58435335 P2093 Q58435335-CC50C3FB-7E1F-4225-873B-443CCAA4B815 @default.
- Q58435335 P304 Q58435335-32F36E83-037C-4E1B-B7EA-0B15985CE338 @default.
- Q58435335 P31 Q58435335-862E11C9-47F2-45D0-B1A5-203855CAD472 @default.
- Q58435335 P356 Q58435335-BF59866D-EE37-4E5F-944B-64F5D285EE81 @default.
- Q58435335 P433 Q58435335-6854F149-5D84-4182-99D2-25084ECB17A4 @default.
- Q58435335 P478 Q58435335-FDEE356E-3AF9-434D-8A7B-D895410812BF @default.
- Q58435335 P50 Q58435335-79A8E99F-96B5-4704-A0BC-50F4F41FC8A2 @default.
- Q58435335 P577 Q58435335-8B576237-4276-40D8-9029-4670FD7A39EC @default.
- Q58435335 P921 Q58435335-4F237ADF-70B9-4A9C-95F6-C7E18AFDF2FD @default.
- Q58435335 P356 J.SYNTHMET.2005.01.031 @default.
- Q58435335 P1433 Q3508925 @default.
- Q58435335 P1476 "Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films" @default.
- Q58435335 P2093 "D.D.C. Bradley" @default.
- Q58435335 P2093 "P.G. Etchegoin" @default.
- Q58435335 P304 "279-282" @default.
- Q58435335 P31 Q13442814 @default.
- Q58435335 P356 "10.1016/J.SYNTHMET.2005.01.031" @default.
- Q58435335 P433 "2" @default.
- Q58435335 P478 "155" @default.
- Q58435335 P50 Q42044415 @default.
- Q58435335 P577 "2005-11-01T00:00:00Z" @default.
- Q58435335 P921 Q1137203 @default.