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- Q58793412 description "article scientifique publié en 2004" @default.
- Q58793412 description "im September 2004 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58793412 description "wetenschappelijk artikel" @default.
- Q58793412 description "наукова стаття, опублікована у вересні 2004" @default.
- Q58793412 name "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 name "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 type Item @default.
- Q58793412 label "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 label "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 prefLabel "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 prefLabel "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 P1433 Q58793412-28126674-9AF4-4DF7-AC62-2A1A0ABE6B13 @default.
- Q58793412 P1476 Q58793412-A6F5DB63-8115-4B02-93F6-9A6AB5AE19F2 @default.
- Q58793412 P2093 Q58793412-18E18EA3-0B34-40D3-978E-E3D53BC67D9F @default.
- Q58793412 P2093 Q58793412-90C937AD-4C8A-4FAB-AEC7-A4453C3E6EBC @default.
- Q58793412 P2093 Q58793412-A5A5CB46-F588-4D23-88FE-4810511B89F5 @default.
- Q58793412 P2093 Q58793412-D0602795-7F4C-40CF-9C36-9E9EA0847CF6 @default.
- Q58793412 P304 Q58793412-D78E28BE-1454-41A8-BE05-D2EDE6C8D8A9 @default.
- Q58793412 P31 Q58793412-3E3564B4-8649-4846-ADDD-A2E3F3723D77 @default.
- Q58793412 P356 Q58793412-722161F2-9121-4794-9477-402EA7857B72 @default.
- Q58793412 P433 Q58793412-A3A1CC83-5B7F-4C59-AB22-C7C986103925 @default.
- Q58793412 P478 Q58793412-ED31A53C-33AA-4C28-B407-365935D4C89F @default.
- Q58793412 P50 Q58793412-010C171B-ACEE-4E06-B245-D2903C3E0F55 @default.
- Q58793412 P50 Q58793412-20FE733D-18F0-4456-AE42-E524FF1DF28F @default.
- Q58793412 P50 Q58793412-5CA472EA-0D45-4E56-9576-B07F6BA0BB7B @default.
- Q58793412 P50 Q58793412-ED1F972A-4478-4D24-AFE5-3EDEC205C7F7 @default.
- Q58793412 P577 Q58793412-79B79CCA-28E0-4C53-A0A7-47CE9E9D2BF5 @default.
- Q58793412 P356 J.NIMA.2004.05.059 @default.
- Q58793412 P1433 Q3595365 @default.
- Q58793412 P1476 "Study of the annealing effect on silicon microstrip detectors built on and substrates after proton irradiation" @default.
- Q58793412 P2093 "D. Giordano" @default.
- Q58793412 P2093 "M. de Palma" @default.
- Q58793412 P2093 "P. Tempesta" @default.
- Q58793412 P2093 "V. Radicci" @default.
- Q58793412 P304 "122-127" @default.
- Q58793412 P31 Q13442814 @default.
- Q58793412 P356 "10.1016/J.NIMA.2004.05.059" @default.
- Q58793412 P433 "1-2" @default.
- Q58793412 P478 "530" @default.
- Q58793412 P50 Q118291611 @default.
- Q58793412 P50 Q54988427 @default.
- Q58793412 P50 Q96691164 @default.
- Q58793412 P50 Q96691169 @default.
- Q58793412 P577 "2004-09-01T00:00:00Z" @default.