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- Q58874252 description "article scientifique publié en 2006" @default.
- Q58874252 description "im Juli 2006 veröffentlichter wissenschaftlicher Artikel" @default.
- Q58874252 description "wetenschappelijk artikel" @default.
- Q58874252 description "наукова стаття, опублікована в липні 2006" @default.
- Q58874252 name "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 name "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 type Item @default.
- Q58874252 label "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 label "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 prefLabel "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 prefLabel "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
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- Q58874252 P577 Q58874252-89445B8D-732E-450B-9E31-F4625359226F @default.
- Q58874252 P356 J.TSF.2005.12.133 @default.
- Q58874252 P1433 Q2062139 @default.
- Q58874252 P1476 "Analysis of structure and defects in thin silicon films deposited from hydrogen diluted silane" @default.
- Q58874252 P2093 "F.D. Tichelaar" @default.
- Q58874252 P2093 "G. van Elzakker" @default.
- Q58874252 P2093 "J.W. Metselaar" @default.
- Q58874252 P2093 "M. Zeman" @default.
- Q58874252 P2093 "V. Nádaždy" @default.
- Q58874252 P2860 Q29398678 @default.
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- Q58874252 P304 "252-257" @default.
- Q58874252 P31 Q13442814 @default.
- Q58874252 P356 "10.1016/J.TSF.2005.12.133" @default.
- Q58874252 P478 "511-512" @default.
- Q58874252 P577 "2006-07-01T00:00:00Z" @default.