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- Q59211299 description "article scientifique publié en 2002" @default.
- Q59211299 description "im Jahr 2002 veröffentlichter wissenschaftlicher Artikel" @default.
- Q59211299 description "wetenschappelijk artikel" @default.
- Q59211299 description "наукова стаття, опублікована у 2002" @default.
- Q59211299 name "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 name "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 type Item @default.
- Q59211299 label "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 label "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 prefLabel "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 prefLabel "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 P1433 Q59211299-64B1AE28-4BFB-4398-9A39-91ABA5EBE3BC @default.
- Q59211299 P1476 Q59211299-41625EAB-7784-4049-98A0-C04A75AEF969 @default.
- Q59211299 P2093 Q59211299-89191E07-0171-4ECE-AB6E-84BF893BA741 @default.
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- Q59211299 P2093 Q59211299-B4EED624-FDE0-4CA6-9161-E05E3E7A422C @default.
- Q59211299 P2093 Q59211299-FB16E506-2CBF-463B-BE13-243E210C5E02 @default.
- Q59211299 P304 Q59211299-D901DE70-548D-4036-BA87-BC723A0ABF3F @default.
- Q59211299 P31 Q59211299-35226F98-7B97-46B3-A816-8A100E097903 @default.
- Q59211299 P356 Q59211299-86DC6447-519E-42FD-B987-2B38687D1247 @default.
- Q59211299 P433 Q59211299-FD210AB4-455E-4881-A81E-7560186D8CEC @default.
- Q59211299 P478 Q59211299-7AAE6797-4E2F-4288-B9A7-815E07C2B764 @default.
- Q59211299 P577 Q59211299-E8D6EC1C-D2FB-4DB5-A94D-09EABDBD69DA @default.
- Q59211299 P356 1.1502701 @default.
- Q59211299 P1433 Q29043658 @default.
- Q59211299 P1476 "Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy" @default.
- Q59211299 P2093 "G. Lubarsky" @default.
- Q59211299 P2093 "N. Ashkenasy" @default.
- Q59211299 P2093 "R. Shikler" @default.
- Q59211299 P2093 "Y. Rosenwaks" @default.
- Q59211299 P304 "1914" @default.
- Q59211299 P31 Q13442814 @default.
- Q59211299 P356 "10.1116/1.1502701" @default.
- Q59211299 P433 "5" @default.
- Q59211299 P478 "20" @default.
- Q59211299 P577 "2002-01-01T00:00:00Z" @default.