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- Q59423096 description "im April 2004 veröffentlichter wissenschaftlicher Artikel" @default.
- Q59423096 description "wetenschappelijk artikel" @default.
- Q59423096 description "наукова стаття, опублікована у квітні 2004" @default.
- Q59423096 name "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
- Q59423096 name "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
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- Q59423096 label "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
- Q59423096 label "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
- Q59423096 prefLabel "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
- Q59423096 prefLabel "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
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- Q59423096 P1476 "Nanoscale electrical characterization of trap-assisted quasibreakdown fluctuations in SiO2" @default.
- Q59423096 P2093 "C. I. Pakes" @default.
- Q59423096 P2093 "D. N. Jamieson" @default.
- Q59423096 P2093 "S. Prawer" @default.
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- Q59423096 P356 "10.1063/1.1712033" @default.
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- Q59423096 P577 "2004-04-19T00:00:00Z" @default.