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- Q59709515 description "article scientifique publié en 2005" @default.
- Q59709515 description "im Mai 2005 veröffentlichter wissenschaftlicher Artikel" @default.
- Q59709515 description "wetenschappelijk artikel" @default.
- Q59709515 description "наукова стаття, опублікована в травні 2005" @default.
- Q59709515 name "Thickness determination of thin (∼20nm) microcrystalline silicon layers" @default.
- Q59709515 name "Thickness determination of thin" @default.
- Q59709515 type Item @default.
- Q59709515 label "Thickness determination of thin (∼20nm) microcrystalline silicon layers" @default.
- Q59709515 label "Thickness determination of thin" @default.
- Q59709515 prefLabel "Thickness determination of thin (∼20nm) microcrystalline silicon layers" @default.
- Q59709515 prefLabel "Thickness determination of thin" @default.
- Q59709515 P1433 Q59709515-2C2EF6C0-6F44-4C13-9F48-B7FFE86BEE0F @default.
- Q59709515 P1476 Q59709515-E16F339B-78FA-465E-B03D-1F9E9AF7E936 @default.
- Q59709515 P2093 Q59709515-0FF9ADBA-009F-4A6F-B200-515C94ECB698 @default.
- Q59709515 P2093 Q59709515-4A4C23D2-BE3F-4FC8-9EFA-C5EAB204A81D @default.
- Q59709515 P2093 Q59709515-516DA9E5-3191-489E-A53E-AE5CF777B375 @default.
- Q59709515 P2093 Q59709515-8CD1E33A-1299-4A3B-A601-C5C4C7FA15A8 @default.
- Q59709515 P2093 Q59709515-9C3972D0-16CB-42B9-B94F-E55F5909CA4D @default.
- Q59709515 P2093 Q59709515-B38AB9A6-C690-4C85-9D31-35108D13AD7A @default.
- Q59709515 P304 Q59709515-5831F500-E247-4C7B-B919-23246724E348 @default.
- Q59709515 P31 Q59709515-DD206957-7E83-4A72-BA8F-79128D81E9A9 @default.
- Q59709515 P356 Q59709515-8BE3C7C3-9738-48A8-852E-82C917C1C160 @default.
- Q59709515 P433 Q59709515-C37C4A4B-E849-40C2-B836-9992F4683FE6 @default.
- Q59709515 P478 Q59709515-1EAFAD8F-1934-4C70-BE3E-6F3D0CF0703A @default.
- Q59709515 P577 Q59709515-D4812ADE-F49D-47E5-869D-E37D61975C29 @default.
- Q59709515 P356 J.SOLMAT.2004.09.016 @default.
- Q59709515 P1433 Q7555888 @default.
- Q59709515 P1476 "Thickness determination of thin (∼20nm) microcrystalline silicon layers" @default.
- Q59709515 P2093 "A. Gordijn" @default.
- Q59709515 P2093 "F.D. Tichelaar" @default.
- Q59709515 P2093 "J. Löffler" @default.
- Q59709515 P2093 "J.K. Rath" @default.
- Q59709515 P2093 "R.E.I. Schropp" @default.
- Q59709515 P2093 "W.M. Arnoldbik" @default.
- Q59709515 P304 "445-455" @default.
- Q59709515 P31 Q13442814 @default.
- Q59709515 P356 "10.1016/J.SOLMAT.2004.09.016" @default.
- Q59709515 P433 "1-4" @default.
- Q59709515 P478 "87" @default.
- Q59709515 P577 "2005-05-01T00:00:00Z" @default.