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- Q59745987 description "article scientifique publié en 2012" @default.
- Q59745987 description "im April 2012 veröffentlichter wissenschaftlicher Artikel" @default.
- Q59745987 description "wetenschappelijk artikel" @default.
- Q59745987 description "наукова стаття, опублікована у квітні 2012" @default.
- Q59745987 name "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 name "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 type Item @default.
- Q59745987 label "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 label "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 prefLabel "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 prefLabel "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
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- Q59745987 P1476 Q59745987-596445F6-D4EC-4B9F-A834-43775ACCFA6C @default.
- Q59745987 P2093 Q59745987-40E531FE-B6EE-4F31-B2DE-DCF5998DFB31 @default.
- Q59745987 P2888 Q59745987-C6F673B0-4DC6-4E75-B5BD-B004DCCFA8ED @default.
- Q59745987 P304 Q59745987-09144025-5270-4AC0-9FB0-0A377DF0C615 @default.
- Q59745987 P31 Q59745987-A91E52CA-1461-4400-955F-4C8BECFB00ED @default.
- Q59745987 P356 Q59745987-F3CB37B1-EBD9-4714-9913-A7529181DF61 @default.
- Q59745987 P433 Q59745987-14D65202-6162-4AF7-B9DB-EBAF053CCA82 @default.
- Q59745987 P478 Q59745987-39F49CDD-38C5-4556-BBD1-907AA4D4C61A @default.
- Q59745987 P50 Q59745987-B2356FEE-17B3-407A-8B12-538E4E15B5E1 @default.
- Q59745987 P577 Q59745987-34B37B4E-8D44-4C91-BCE5-236998747946 @default.
- Q59745987 P921 Q59745987-879D3F45-6B66-4AA1-B669-23CF8BC8E5A0 @default.
- Q59745987 P356 S11664-012-2039-0 @default.
- Q59745987 P1433 Q2197685 @default.
- Q59745987 P1476 "Scanning Seebeck Coefficient Measurement System for Homogeneity Characterization of Bulk and Thin-Film Thermoelectric Materials" @default.
- Q59745987 P2093 "Shiho Iwanaga" @default.
- Q59745987 P2888 s11664-012-2039-0 @default.
- Q59745987 P304 "1667-1674" @default.
- Q59745987 P31 Q13442814 @default.
- Q59745987 P356 "10.1007/S11664-012-2039-0" @default.
- Q59745987 P433 "6" @default.
- Q59745987 P478 "41" @default.
- Q59745987 P50 Q59669628 @default.
- Q59745987 P577 "2012-04-03T00:00:00Z" @default.
- Q59745987 P921 Q1137203 @default.