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- Q60158318 description "im Mai 2010 veröffentlichter wissenschaftlicher Artikel" @default.
- Q60158318 description "wetenschappelijk artikel" @default.
- Q60158318 description "наукова стаття, опублікована в травні 2010" @default.
- Q60158318 name "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 name "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 type Item @default.
- Q60158318 label "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 label "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 prefLabel "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 prefLabel "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 P1433 Q60158318-273DBD73-8106-42E7-8779-7EA1D9EEC56E @default.
- Q60158318 P1476 Q60158318-BDFDF3DA-5B48-40B4-9298-AA7E6557AB7E @default.
- Q60158318 P2093 Q60158318-29E1D6B5-CC3F-4352-A31B-C199922ED0E3 @default.
- Q60158318 P2093 Q60158318-D403BBBF-426B-415D-9B26-55046BC619B8 @default.
- Q60158318 P304 Q60158318-FEC01F64-7D00-4640-AD07-65CA63039EE9 @default.
- Q60158318 P31 Q60158318-7DC77882-6560-4913-8553-A1D2D2119C37 @default.
- Q60158318 P356 Q60158318-654F0025-BD85-4EBE-B168-20CCAD15CF18 @default.
- Q60158318 P433 Q60158318-1082557B-A0A8-4108-877D-79F19C9A2191 @default.
- Q60158318 P478 Q60158318-F0718E25-914E-40C9-81B3-7AE64376983A @default.
- Q60158318 P577 Q60158318-77099D04-A533-4226-8FB6-FBC4347208E2 @default.
- Q60158318 P6104 Q60158318-73CC56D5-B186-4ABA-84CF-E175238C9F89 @default.
- Q60158318 P894 Q60158318-6DD2BD1D-AFE2-465B-912E-C5B0DEB31603 @default.
- Q60158318 P921 Q60158318-A556EA53-5D96-4632-9154-14D9BB197283 @default.
- Q60158318 P356 J.IJSOLSTR.2010.02.001 @default.
- Q60158318 P1433 Q15760998 @default.
- Q60158318 P1476 "Cohesive modeling of crack nucleation under diffusion induced stresses in a thin strip: Implications on the critical size for flaw tolerant battery electrodes" @default.
- Q60158318 P2093 "Huajian Gao" @default.
- Q60158318 P2093 "Tanmay K. Bhandakkar" @default.
- Q60158318 P304 "1424-1434" @default.
- Q60158318 P31 Q13442814 @default.
- Q60158318 P356 "10.1016/J.IJSOLSTR.2010.02.001" @default.
- Q60158318 P433 "10" @default.
- Q60158318 P478 "47" @default.
- Q60158318 P577 "2010-05-01T00:00:00Z" @default.
- Q60158318 P6104 Q8487137 @default.
- Q60158318 P894 "1193.74142" @default.
- Q60158318 P921 Q214781 @default.