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- Q60218975 description "artículu científicu" @default.
- Q60218975 description "wetenschappelijk artikel" @default.
- Q60218975 description "наукова стаття, опублікована в березні 2011" @default.
- Q60218975 name "Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction" @default.
- Q60218975 name "Thermal Residual Stress Relaxation in Sputtered ZnO Film on" @default.
- Q60218975 type Item @default.
- Q60218975 label "Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction" @default.
- Q60218975 label "Thermal Residual Stress Relaxation in Sputtered ZnO Film on" @default.
- Q60218975 prefLabel "Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction" @default.
- Q60218975 prefLabel "Thermal Residual Stress Relaxation in Sputtered ZnO Film on" @default.
- Q60218975 P1476 Q60218975-E4E50302-093F-49ED-99BA-7D710EBBF1A5 @default.
- Q60218975 P2093 Q60218975-068AB7C2-790B-4C44-BFC7-5D3EC5A2FCF6 @default.
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- Q60218975 P2093 Q60218975-470700EC-15A7-4B94-9791-23B02A6608A9 @default.
- Q60218975 P2093 Q60218975-4887620B-06C3-4E0A-98A2-6A8570B4154F @default.
- Q60218975 P2093 Q60218975-91D06737-9692-4E57-8C3A-09566A6D730F @default.
- Q60218975 P2093 Q60218975-EB1DFD29-0583-4B61-825E-00398F9C2405 @default.
- Q60218975 P2860 Q60218975-4ECB21BF-DFCC-4722-9629-2B4648097E62 @default.
- Q60218975 P304 Q60218975-8D20FBAB-5EF4-47FB-A232-382FF60E8C69 @default.
- Q60218975 P31 Q60218975-B97BE584-CDB8-41A9-A194-7B2F7159E1BA @default.
- Q60218975 P356 Q60218975-F5E9D20B-E69C-4BBE-A971-67AF0558B8E6 @default.
- Q60218975 P478 Q60218975-F017F340-531A-419A-AC82-AA10A0B971BB @default.
- Q60218975 P50 Q60218975-10F16A6E-7C50-4724-AC08-E42814C892E0 @default.
- Q60218975 P50 Q60218975-1699E68D-AAC5-4771-9C37-568EF1B85405 @default.
- Q60218975 P50 Q60218975-61AA62A5-1383-4299-904C-26F727D5E0C1 @default.
- Q60218975 P577 Q60218975-68F217FB-B051-417F-8280-124016106F55 @default.
- Q60218975 P356 MSF.681.127 @default.
- Q60218975 P1476 "Thermal Residual Stress Relaxation in Sputtered ZnO Film on (100) Si Substrate Studied In Situ by Synchrotron X-Ray Diffraction" @default.
- Q60218975 P2093 "Alessandro Benedetto" @default.
- Q60218975 P2093 "Christopher Krauss" @default.
- Q60218975 P2093 "Etienne Barthel" @default.
- Q60218975 P2093 "Florine Conchon" @default.
- Q60218975 P2093 "Guillaume Geandier" @default.
- Q60218975 P2093 "Sergey.Y. Grachev" @default.
- Q60218975 P2860 Q114737717 @default.
- Q60218975 P304 "127-132" @default.
- Q60218975 P31 Q13442814 @default.
- Q60218975 P356 "10.4028/WWW.SCIENTIFIC.NET/MSF.681.127" @default.
- Q60218975 P478 "681" @default.
- Q60218975 P50 Q57901879 @default.
- Q60218975 P50 Q59052575 @default.
- Q60218975 P50 Q60221024 @default.
- Q60218975 P577 "2011-03-01T00:00:00Z" @default.