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- Q60358236 description "article scientifique publié en 2004" @default.
- Q60358236 description "im Dezember 2004 veröffentlichter wissenschaftlicher Artikel" @default.
- Q60358236 description "scholarly article by Mario Birkholz et al published 15 December 2004 in Journal of Applied Physics" @default.
- Q60358236 description "wetenschappelijk artikel" @default.
- Q60358236 description "наукова стаття, опублікована в грудні 2004" @default.
- Q60358236 name "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 name "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 type Item @default.
- Q60358236 label "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 label "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 prefLabel "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 prefLabel "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
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- Q60358236 P1476 Q60358236-C42052A7-DB4F-4EAA-A877-FE5107242F44 @default.
- Q60358236 P2093 Q60358236-945E44B6-8662-4B1D-90E6-2AF16E12E099 @default.
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- Q60358236 P304 Q60358236-47E45718-2C18-4781-BFB7-4BD3C21656C0 @default.
- Q60358236 P31 Q60358236-1FA86144-4D2C-489B-9B71-476C17A516C9 @default.
- Q60358236 P356 Q60358236-8A53D18B-1E8C-410D-8839-4E782274448A @default.
- Q60358236 P433 Q60358236-82C68E60-6574-4C7A-B946-A45A6663EFB9 @default.
- Q60358236 P478 Q60358236-B052155A-F58E-45CD-BEBF-B2C66AA79083 @default.
- Q60358236 P50 Q60358236-42609D3B-9708-4EBD-ADA3-3BFE7DE3C9ED @default.
- Q60358236 P577 Q60358236-AB44A442-C05E-467E-A76B-6C7E6C40D377 @default.
- Q60358236 P921 Q60358236-78EB37BA-9281-46C4-9EE9-B8B7B2E4077B @default.
- Q60358236 P921 Q60358236-b18c4773-623d-405f-bb53-150940d2f627 @default.
- Q60358236 P356 1.1814413 @default.
- Q60358236 P1433 Q1987941 @default.
- Q60358236 P1476 "X-ray diffraction study on residual stress and preferred orientation in thin titanium films subjected to a high ion flux during deposition" @default.
- Q60358236 P2093 "C. Genzel" @default.
- Q60358236 P2093 "T. Jung" @default.
- Q60358236 P304 "7202-7211" @default.
- Q60358236 P31 Q13442814 @default.
- Q60358236 P356 "10.1063/1.1814413" @default.
- Q60358236 P433 "12" @default.
- Q60358236 P478 "96" @default.
- Q60358236 P50 Q41034035 @default.
- Q60358236 P577 "2004-12-15T00:00:00Z" @default.
- Q60358236 P921 Q12101244 @default.
- Q60358236 P921 Q716 @default.