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- Q61041329 description "article scientifique publié en 2002" @default.
- Q61041329 description "article" @default.
- Q61041329 description "wetenschappelijk artikel" @default.
- Q61041329 description "наукова стаття, опублікована у квітні 2002" @default.
- Q61041329 name "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 name "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 type Item @default.
- Q61041329 label "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 label "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 prefLabel "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 prefLabel "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 P1433 Q61041329-6C4745EC-ACA6-40E5-9A8D-A0E45FA20CEA @default.
- Q61041329 P1476 Q61041329-0B67F558-A29D-4AF0-BA94-C24BEE45EFEB @default.
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- Q61041329 P2093 Q61041329-92798A30-433D-40AF-BFBA-2DC87299F51E @default.
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- Q61041329 P304 Q61041329-449FC7CF-075C-4F95-9192-969731CE8517 @default.
- Q61041329 P31 Q61041329-ADDDB5BD-7436-48B5-9146-0E4FE463EA76 @default.
- Q61041329 P356 Q61041329-3B8135B9-C8E4-46C5-ACF5-8B56807C1E3E @default.
- Q61041329 P433 Q61041329-03E84D39-AD59-478A-AB36-78605D7ABBDD @default.
- Q61041329 P478 Q61041329-8443B140-B1D2-43E5-97AA-A678E21C03B5 @default.
- Q61041329 P50 Q61041329-0D90F10B-68A6-4A19-9DA5-4C97A1DD7AAA @default.
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- Q61041329 P577 Q61041329-C6CE056C-7F0C-40CF-9ECA-AE2562AFACB3 @default.
- Q61041329 P356 S0022-0248(02)00910-7 @default.
- Q61041329 P1433 Q1929756 @default.
- Q61041329 P1476 "Real-time calibration of wafer temperature, growth rate and composition by optical in-situ techniques during AlxGa1−xAs growth in MOVPE" @default.
- Q61041329 P2093 "A. Kaluza" @default.
- Q61041329 P2093 "J.-T. Zettler" @default.
- Q61041329 P2093 "K. Haberland" @default.
- Q61041329 P2093 "M. Zorn" @default.
- Q61041329 P2093 "W. Richter" @default.
- Q61041329 P2860 Q63790549 @default.
- Q61041329 P2860 Q63790553 @default.
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- Q61041329 P2860 Q74369415 @default.
- Q61041329 P2860 Q74515998 @default.
- Q61041329 P304 "87-97" @default.
- Q61041329 P31 Q13442814 @default.
- Q61041329 P356 "10.1016/S0022-0248(02)00910-7" @default.
- Q61041329 P433 "1-2" @default.
- Q61041329 P478 "240" @default.
- Q61041329 P50 Q39183528 @default.
- Q61041329 P50 Q52350375 @default.
- Q61041329 P50 Q56557657 @default.
- Q61041329 P577 "2002-04-01T00:00:00Z" @default.