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- Q61825902 description "1992 ജനുവരി 1 നു പ്രസിദ്ധീകരിച്ച ശാസ്ത്ര ലേഖനം" @default.
- Q61825902 description "article scientifique publié en 1992" @default.
- Q61825902 description "artículu científicu" @default.
- Q61825902 description "wetenschappelijk artikel" @default.
- Q61825902 description "наукова стаття, опублікована в січні 1992" @default.
- Q61825902 name "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 name "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 type Item @default.
- Q61825902 label "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 label "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 prefLabel "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 prefLabel "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 P1433 Q61825902-A976376D-7E2C-4EF6-A04B-E604027D6525 @default.
- Q61825902 P1476 Q61825902-6E3A68C1-7A49-4F18-8162-0238DAC83D6C @default.
- Q61825902 P2093 Q61825902-7570688C-0B5D-4849-A216-0A45D9638537 @default.
- Q61825902 P2093 Q61825902-7BE8E84D-4763-4D44-B45D-1B95CB9F66FE @default.
- Q61825902 P304 Q61825902-9C49B809-EFAC-4116-ADF8-FA1A0EE2C311 @default.
- Q61825902 P31 Q61825902-18EC350C-34F1-4871-BE5F-12AA4FFDA881 @default.
- Q61825902 P356 Q61825902-5D5D32A5-8074-41C5-8795-363835404DC6 @default.
- Q61825902 P478 Q61825902-10986C3F-CAAF-414E-B87D-FDDC9E7BC8CB @default.
- Q61825902 P50 Q61825902-034DB375-6607-463D-BFB1-5D98B7CB788A @default.
- Q61825902 P50 Q61825902-37C364A2-951F-4C7F-B713-EAEBF345BAA3 @default.
- Q61825902 P50 Q61825902-B1149425-3919-4FA0-AE8D-2512E95D9CA3 @default.
- Q61825902 P577 Q61825902-B3AD50A0-74F3-4E29-852D-6EE13127885D @default.
- Q61825902 P921 Q61825902-177139F9-0BE5-4980-BE92-C3197052AB88 @default.
- Q61825902 P356 0169-4332(92)90351-W @default.
- Q61825902 P1433 Q2772524 @default.
- Q61825902 P1476 "Influence of the silicon wafer cleaning treatment on the Si/SiO2 interfaces analyzed by infrared spectroscopy" @default.
- Q61825902 P2093 "B. Garrido" @default.
- Q61825902 P2093 "J. Samitier" @default.
- Q61825902 P304 "861-865" @default.
- Q61825902 P31 Q13442814 @default.
- Q61825902 P356 "10.1016/0169-4332(92)90351-W" @default.
- Q61825902 P478 "56-58" @default.
- Q61825902 P50 Q58378427 @default.
- Q61825902 P50 Q58476301 @default.
- Q61825902 P50 Q58810618 @default.
- Q61825902 P577 "1992-01-01T00:00:00Z" @default.
- Q61825902 P921 Q70906 @default.