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- Q62445666 description "article scientifique publié en 2015" @default.
- Q62445666 description "im Januar 2015 veröffentlichter wissenschaftlicher Artikel" @default.
- Q62445666 description "wetenschappelijk artikel" @default.
- Q62445666 description "наукова стаття, опублікована в січні 2015" @default.
- Q62445666 name "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 name "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 type Item @default.
- Q62445666 label "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 label "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 prefLabel "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 prefLabel "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 P1433 Q62445666-62C1A84C-457B-4C23-8ECA-CED7911D7852 @default.
- Q62445666 P1476 Q62445666-997D4CA2-BAE4-47ED-8CFF-E74EF2054B38 @default.
- Q62445666 P2093 Q62445666-157CEC6B-6DD9-477E-A2AF-94CE27E7A129 @default.
- Q62445666 P2093 Q62445666-2F6C102B-5EF9-49FF-87BF-3C2F813420F4 @default.
- Q62445666 P2093 Q62445666-6D4BA953-B4FB-48A5-B1FC-0DACDB0098F0 @default.
- Q62445666 P2093 Q62445666-CB90FE98-F43D-4754-BC36-9F89D28AAFEE @default.
- Q62445666 P2093 Q62445666-CDCDA145-6176-4CAB-AEB4-6BD1FAFCD139 @default.
- Q62445666 P304 Q62445666-E266EF8B-2DC5-4BA5-BF2B-A6CC8089F8C0 @default.
- Q62445666 P31 Q62445666-C74657DB-C7A4-4BF7-9A6A-BF841FE26975 @default.
- Q62445666 P356 Q62445666-3018EB14-AF42-417B-A3BC-E5E37678FA7B @default.
- Q62445666 P407 Q62445666-2E6B6919-144F-4F96-8EA7-B4B9ACD0FFB9 @default.
- Q62445666 P433 Q62445666-98478E98-8D70-47D4-BC8E-23C74288246A @default.
- Q62445666 P478 Q62445666-49FD372D-6E93-432F-8111-E3E0CB05322F @default.
- Q62445666 P577 Q62445666-01B67E4E-9544-4FEC-B500-7D6327A46AF9 @default.
- Q62445666 P724 Q62445666-A4DC0560-B633-4803-AD9E-B166AC10CCFC @default.
- Q62445666 P818 Q62445666-ECF6153A-B21E-4179-A40B-7F7629200825 @default.
- Q62445666 P356 1.4906199 @default.
- Q62445666 P1433 Q621615 @default.
- Q62445666 P1476 "Remote surface roughness scattering in fully depleted silicon-on-insulator devices with high-κ/SiO2 gate stacks" @default.
- Q62445666 P2093 "D. Rideau" @default.
- Q62445666 P2093 "F. Triozon" @default.
- Q62445666 P2093 "I. Duchemin" @default.
- Q62445666 P2093 "V.-H. Nguyen" @default.
- Q62445666 P2093 "Y. M. Niquet" @default.
- Q62445666 P304 "023508" @default.
- Q62445666 P31 Q13442814 @default.
- Q62445666 P356 "10.1063/1.4906199" @default.
- Q62445666 P407 Q1860 @default.
- Q62445666 P433 "2" @default.
- Q62445666 P478 "106" @default.
- Q62445666 P577 "2015-01-12T00:00:00Z" @default.
- Q62445666 P724 "arxiv-1504.01881" @default.
- Q62445666 P818 "1504.01881" @default.