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- Q62519276 description "article scientifique publié en 1995" @default.
- Q62519276 description "im Februar 1995 veröffentlichter wissenschaftlicher Artikel" @default.
- Q62519276 description "wetenschappelijk artikel" @default.
- Q62519276 description "наукова стаття, опублікована в лютому 1995" @default.
- Q62519276 name "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 name "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 type Item @default.
- Q62519276 label "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 label "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 prefLabel "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 prefLabel "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 P1433 Q62519276-AC38E988-9E57-4B1A-97A3-D5ECBB56D6C4 @default.
- Q62519276 P1476 Q62519276-E03633BF-ED8F-443E-8816-41F475391D58 @default.
- Q62519276 P2093 Q62519276-408D9F29-838F-4B80-A771-233EAFFCD562 @default.
- Q62519276 P2093 Q62519276-EC266364-9810-435C-AF05-31A4972A1D1C @default.
- Q62519276 P304 Q62519276-D5916436-80A4-4B04-BF87-6834CCC860CF @default.
- Q62519276 P31 Q62519276-998A7581-8DA5-41FD-B86A-4A3550E10AFA @default.
- Q62519276 P356 Q62519276-F63CC4AA-4F8B-484A-BAF3-1062A050F33E @default.
- Q62519276 P433 Q62519276-92FD4D56-4F25-4855-98F5-8D8FDDD0478C @default.
- Q62519276 P478 Q62519276-25F4CD68-9E4E-42F7-9A4A-748689C7A5B8 @default.
- Q62519276 P577 Q62519276-3BF32E6F-371D-4963-A064-2547F0C0D692 @default.
- Q62519276 P921 Q62519276-2DF0229E-4516-4AE2-B811-3F4A5BA14C4F @default.
- Q62519276 P921 Q62519276-BCF249C6-4C1F-4790-85D9-6754EC94B556 @default.
- Q62519276 P356 JJAP.34.874 @default.
- Q62519276 P1433 Q2366671 @default.
- Q62519276 P1476 "Computer Simulation and Measurement of Capacitance-Voltage Characteristics in Quantum Wire Devices of Trench-Oxide MOS Structure" @default.
- Q62519276 P2093 "Shunri Oda" @default.
- Q62519276 P2093 "Tetsuya Tsukui" @default.
- Q62519276 P304 "874-877" @default.
- Q62519276 P31 Q13442814 @default.
- Q62519276 P356 "10.1143/JJAP.34.874" @default.
- Q62519276 P433 "Part 1, No. 2B" @default.
- Q62519276 P478 "34" @default.
- Q62519276 P577 "1995-02-28T00:00:00Z" @default.
- Q62519276 P921 Q613814 @default.
- Q62519276 P921 Q925667 @default.