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- Q62600402 description "article scientifique publié en 2003" @default.
- Q62600402 description "wetenschappelijk artikel" @default.
- Q62600402 description "наукова стаття, опублікована у вересні 2003" @default.
- Q62600402 name "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 name "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 type Item @default.
- Q62600402 label "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 label "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 prefLabel "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 prefLabel "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 P1433 Q62600402-DBD261FD-2F03-4230-9C09-B67C8587A40B @default.
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- Q62600402 P433 Q62600402-45474A1A-8A6E-4BD1-813E-B5E969FD74FB @default.
- Q62600402 P478 Q62600402-25286503-A413-443F-9F3B-8FACD490ED5F @default.
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- Q62600402 P921 Q62600402-4FDF14BB-0E8A-4C57-8D1D-B0BE6DE165CA @default.
- Q62600402 P356 S0026-2714(03)00321-4 @default.
- Q62600402 P8978 AyalewGPGS03 @default.
- Q62600402 P1433 Q13852898 @default.
- Q62600402 P1476 "Improving SiC lateral DMOSFET reliability under high field stress" @default.
- Q62600402 P2093 "A. Gehring" @default.
- Q62600402 P2093 "J.M. Park" @default.
- Q62600402 P2093 "T. Ayalew" @default.
- Q62600402 P2093 "T. Grasser" @default.
- Q62600402 P304 "1889-1894" @default.
- Q62600402 P31 Q13442814 @default.
- Q62600402 P356 "10.1016/S0026-2714(03)00321-4" @default.
- Q62600402 P433 "9-11" @default.
- Q62600402 P478 "43" @default.
- Q62600402 P50 Q112212 @default.
- Q62600402 P577 "2003-09-01T00:00:00Z" @default.
- Q62600402 P8978 "journals/mr/AyalewGPGS03" @default.
- Q62600402 P921 Q214781 @default.