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- Q62675583 description "article" @default.
- Q62675583 description "wetenschappelijk artikel" @default.
- Q62675583 description "наукова стаття, опублікована в червні 1997" @default.
- Q62675583 description "հոդված" @default.
- Q62675583 name "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 name "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 type Item @default.
- Q62675583 label "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 label "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 prefLabel "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 prefLabel "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 P1433 Q62675583-F790493A-C1EC-4A73-9532-7EEA048FE940 @default.
- Q62675583 P1476 Q62675583-0B577D41-F2B1-433A-86E0-CB5B9391322A @default.
- Q62675583 P2093 Q62675583-46883911-2271-497C-98D5-A3CA6040FED5 @default.
- Q62675583 P2093 Q62675583-61C4A7CF-8420-4861-A339-86D508CC50E1 @default.
- Q62675583 P2093 Q62675583-84EBDE5B-FFB3-42BF-8FC3-09E60D79A683 @default.
- Q62675583 P2093 Q62675583-B0DA1B22-509F-4BA8-B8F6-99143170E40D @default.
- Q62675583 P2093 Q62675583-D94E851A-9605-48BD-90A6-237C5F0CC56B @default.
- Q62675583 P2860 Q62675583-7382A61E-8554-49CE-885E-08C38B74A16F @default.
- Q62675583 P2860 Q62675583-AF5E0809-B2CE-472A-A1C5-B0ED3DE9FDC2 @default.
- Q62675583 P2860 Q62675583-CE5EBD5A-6F30-4DCF-8A1B-52543DB77F20 @default.
- Q62675583 P2860 Q62675583-F328E64E-50FB-4F9E-BACD-4B5191695CB9 @default.
- Q62675583 P304 Q62675583-C6B4DC1A-2FB2-4EB6-BFEF-1C5EE92C700B @default.
- Q62675583 P31 Q62675583-5C1113EB-0747-4B38-B3B6-5786410685A8 @default.
- Q62675583 P356 Q62675583-219529E0-71C2-41A8-BAB8-6279DE83B884 @default.
- Q62675583 P478 Q62675583-8573DB58-6632-4C39-9339-1B31B30BD077 @default.
- Q62675583 P577 Q62675583-24665A47-3B9A-41A3-8C3B-AC626DC1B364 @default.
- Q62675583 P356 S0169-4332(97)80074-8 @default.
- Q62675583 P1433 Q2772524 @default.
- Q62675583 P1476 "Effects of interface roughness on the density of interface states at ultrathin oxide/Si interfaces: XPS measurements under biases" @default.
- Q62675583 P2093 "H. Kato" @default.
- Q62675583 P2093 "H. Kobayashi" @default.
- Q62675583 P2093 "Y. Nakato" @default.
- Q62675583 P2093 "Y. Nishioka" @default.
- Q62675583 P2093 "Y. Yamashita" @default.
- Q62675583 P2860 Q56882768 @default.
- Q62675583 P2860 Q62675590 @default.
- Q62675583 P2860 Q62675592 @default.
- Q62675583 P2860 Q62675593 @default.
- Q62675583 P304 "176-180" @default.
- Q62675583 P31 Q13442814 @default.
- Q62675583 P356 "10.1016/S0169-4332(97)80074-8" @default.
- Q62675583 P478 "117-118" @default.
- Q62675583 P577 "1997-06-01T00:00:00Z" @default.