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- Q62743438 description "im September 2004 veröffentlichter wissenschaftlicher Artikel" @default.
- Q62743438 description "wetenschappelijk artikel" @default.
- Q62743438 description "наукова стаття, опублікована у вересні 2004" @default.
- Q62743438 name "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 name "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 type Item @default.
- Q62743438 label "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 label "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 prefLabel "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 prefLabel "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 P1433 Q62743438-E63DB316-53DA-4084-AA63-90B00EBD51C9 @default.
- Q62743438 P1476 Q62743438-A33229DF-F363-480D-84EE-8EDEBBE72D34 @default.
- Q62743438 P2093 Q62743438-131451FD-ABAF-4F63-A253-96875CB08E40 @default.
- Q62743438 P2093 Q62743438-20BCBD13-5CAB-4268-B37C-CFC2F9D626CD @default.
- Q62743438 P2093 Q62743438-4662F201-D1D8-41BE-9D5D-9FF0350891F8 @default.
- Q62743438 P2093 Q62743438-598E6511-7BB7-4FCF-80F3-42F2AB501BFE @default.
- Q62743438 P2093 Q62743438-79A5C8BB-64CD-4485-A7C5-4A6F05EBA698 @default.
- Q62743438 P2093 Q62743438-89CAA092-8059-4EDF-86E1-8B2F84D989D8 @default.
- Q62743438 P2093 Q62743438-94A3D626-629A-4A9C-AE76-0B3E752A4B24 @default.
- Q62743438 P2093 Q62743438-C042EF2D-3AAE-4A99-A803-AE16BCB59630 @default.
- Q62743438 P2093 Q62743438-E2659FE9-D386-4C31-8518-BC65A330C22D @default.
- Q62743438 P304 Q62743438-2EDFD83B-2E5D-43CB-B00E-582BBF56358A @default.
- Q62743438 P31 Q62743438-C9499A01-504E-444D-9354-F110F0BB0B7B @default.
- Q62743438 P356 Q62743438-67764185-3010-4F18-9AD4-9DC5C9D1AE32 @default.
- Q62743438 P433 Q62743438-E10A7358-ED2F-4FC8-84E2-4254901FE2FE @default.
- Q62743438 P478 Q62743438-28D9192A-133C-4034-A289-D23A1F8E7931 @default.
- Q62743438 P577 Q62743438-EB147114-0992-4BDD-97AB-097707EEDAB7 @default.
- Q62743438 P356 012 @default.
- Q62743438 P1433 Q15708713 @default.
- Q62743438 P1476 "Comparison of induced stresses due to electroless versus sputtered copper interconnect technology" @default.
- Q62743438 P2093 "A N Danilewsky" @default.
- Q62743438 P2093 "B H W Toh" @default.
- Q62743438 P2093 "D W McNeill" @default.
- Q62743438 P2093 "J Kanatharana" @default.
- Q62743438 P2093 "J Riikonen" @default.
- Q62743438 P2093 "J Toivonen" @default.
- Q62743438 P2093 "L Knuuttila" @default.
- Q62743438 P2093 "P J McNally" @default.
- Q62743438 P2093 "T Tuomi" @default.
- Q62743438 P304 "1280-1284" @default.
- Q62743438 P31 Q13442814 @default.
- Q62743438 P356 "10.1088/0268-1242/19/11/012" @default.
- Q62743438 P433 "11" @default.
- Q62743438 P478 "19" @default.
- Q62743438 P577 "2004-09-16T00:00:00Z" @default.